Buckling and postbuckling of etching-induced wiggling in a bilayer structure with intrinsic compressive stress

D Okumura, J Sugiura, H Tanaka… - International Journal of …, 2018 - Elsevier
In this study, we investigate buckling and postbuckling of etching-induced wiggling in a
bilayer structure consisting of mask and masked layers. To show effects of explicit modeling …

Onset of wiggling in a microscopic patterned structure induced by intrinsic stress during the dry etching process

H Tanaka, T Hidaka, S Izumi… - Journal of Applied …, 2014 - asmedigitalcollection.asme.org
In semiconductor devices, fine patterning can cause structural instability because of intrinsic
compressive stress. We studied one such instability phenomenon, out-of-plane wiggling of a …

Line-edge roughness increase due to wiggling enhanced by initial pattern waviness

N Kofuji, N Negishi, H Ishimura, T Nishida… - Japanese Journal of …, 2014 - iopscience.iop.org
To clarify whether pattern waviness due to line-edge-roughness enhances wiggling,
distortion of straight and wavy patterns was numerically analyzed by the three-dimensional …

[HTML][HTML] Stress-induced deformation of thin copper substrate in double-sided lapping

J Guo, Z He, B Pan, B Wang, Q Bai, J Kong… - Chinese Journal of …, 2023 - Springer
Double-sided lapping is an precision machining method capable of obtaining high-precision
surface. However, during the lapping process of thin pure copper substrate, the workpiece …

Evaluation of residual stresses in thin films by critical buckling observation of circular microstructures and finite element method

YT Yu, WZ Yuan, DY Qiao, Q Liang - Thin solid films, 2008 - Elsevier
An approach for evaluating residual stresses in thin films by critical buckling observation of
circular microstructures is proposed, by which the states of residual stresses can be …

Mechanism investigation of welding induced buckling using inherent deformation method

J Wang, S Rashed, H Murakawa - Thin-Walled Structures, 2014 - Elsevier
Due to the increasing use of thin plates in lightweight welded structure, welding induced
buckling may occur in such thin plate welded structure. In this study, welding induced …

Development of finite element analysis method for three-dimensional hot bending and direct quench (3DQ) process

H Kubota, A Tomizawa, K Yamamoto… - AIP Conference …, 2013 - pubs.aip.org
The automotive industry has been focusing on developing lighter vehicles to improve fuel
economy and crash safety. In order to meet these requirements, Three Dimensional Hot …

Theoretical predictions and evolutions of wrinkles in the film-intermediate layer-substrate structure under compression

B Wang, B Zhang, H Bi, H Ouyang, Y Huang… - International Journal of …, 2022 - Elsevier
The strategy of tuning the applied compressive strain on the stiff film/intermediate layer/soft
substrate structure (named as the tri-layer structure), which can generate different kinds of …

Benchmark investigation of welding-induced buckling and its critical condition during thin plate butt welding

J Wang, B Yi - Journal of Manufacturing Science …, 2019 - asmedigitalcollection.asme.org
Welding-induced buckling is a special type of welding distortion occurring during thin plate
butt welding and was investigated using both experimental and computational approaches …

Intrinsic stress effects on the warpage of silicon substrate during thin film deposition, photolithography and etching processes

WZ Yao, S Belhenini, F Roqueta… - … and Multi-Physics …, 2016 - ieeexplore.ieee.org
Wafer warpage become more and more critical in the semiconductor industry. As is well
known, the wafer warpage is caused by the mismatch of thermal expansion coefficients …