Y Qiao, NQ Wu, MC Zhou - IEEE Transactions on Automation …, 2012 - ieeexplore.ieee.org
It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and …
NQ Wu, MC Zhou - IEEE Transactions on Automation Science …, 2009 - ieeexplore.ieee.org
Because of wafer residency time constraints for cluster tools, it is very difficult to schedule them. This paper addresses their scheduling issues and conducts their schedulability and …
QH Zhu, NQ Wu, Y Qiao… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
This paper studies the challenging problem of scheduling single-arm multi-cluster tools with wafer residency time constraints. They have a linear topology and their bottleneck tool is …
NQ Wu, MC Zhou - IEEE Transactions on Semiconductor …, 2010 - ieeexplore.ieee.org
When scheduling cluster tools under wafer residency time constraints, wafer sojourn time in a processing module should be carefully controlled such that it is in a permissive range …
NQ Wu, MC Zhou - IEEE Transactions on Automation Science …, 2012 - ieeexplore.ieee.org
Because of residency time constraints and activity time variation of cluster tools, it is very difficult to operate such integrated semiconductor manufacturing equipment. This paper …
Y Qiao, NQ Wu, MC Zhou - IEEE Transactions on …, 2012 - ieeexplore.ieee.org
With wafer residency time constraints, it is crucial to schedule a cluster tool in semiconductor fabrication such that the wafer sojourn time in a processing module is in a given range …
With wafer residency time constraints for some wafer fabrication processes, such as low pressure chemical-vapor deposition, the schedulability and scheduling problems are still …
CR Pan, Y Qiao, NQ Wu… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
This paper addresses the scheduling problem of single-arm cluster tools with both wafer residency time constraints and activity time variation in semiconductor manufacturing. Based …
Y Qiao, MC Zhou, NQ Wu… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
Due to the trends of larger wafer diameters and smaller lot sizes, cluster tools need to switch from processing one lot of wafers to another frequently. This leads to more transient periods …