Focused beams (electrons, ions, and photons) are at the forefront of today's and future
scientific and engineering advanced research instruments. The beams are typically used for …

Focused beams (electrons, ions, and photons) are at the forefront of today's and future
scientific and engineering advanced research instruments. The beams are typically used for …

Analysis by Electron Backscatter Diffraction (EBSD) requires that the sample surface be free
of deformation, oxidation and hydrocarbon contamination. The options for creating such a …

Materials and Methods One of the primary factors to consider while discussing spatial
resolution in the transmission configuration is where the detectable diffraction occurs within …

One of the significant impediments to performing electron backscatter diffraction (EBSD) in
the SEM micro-or nanostructures is sample preparation. Traditional sample preparation …

The use of focused ion beam (FIB) systems, including lithographic applications, has
increased to a higher level in recent years [1]. The imaging, milling and deposition …

Electron Backscatter Diffraction (EBSD) is a well-established Scanning Electron Microscopy
(SEM)-based technique for characterizing the microstructure of crystalline materials with …

Focused Ion Beams (FIB) have become increasingly popular for Electron Back Scatter
Diffraction (EBSD) sample preparation. The underlying ion-solid interactions of the ion beam …

Three-dimensional electron backscatter diffraction (3D-EBSD) has emerged as a powerful
technique for generating 3D crystallographic information of a microstructure at the micro to …

Considered as the newest field of electron microscopy, focused ion beam (FIB) technologies
are used in many fields of science for site-specific analysis, imaging, milling, deposition …