The current status and future prospects of non‐contact atomic force microscopy (nc‐AFM)
and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin …

In the last two decades the atomic force microscope (AFM) has become the premier tool for
topographical analysis of surface structures at the nanometre scale. In its ultimately sensitive …

Atomic force microscopy (AFM) was invented in 1986 by Binnig, Quate, and Gerber as “a
new type of microscope capable of investigating surfaces of insulators on an atomic scale.” …

This book presents the latest developments in noncontact atomic force microscopy. It deals
with the following outstanding functions and applications that have been obtained with …

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical
resource and technique useful for the qualitative and quantitative surface analysis with sub …

This book enlightens readers on the basic surface properties and distance-dependent
intersurface forces one must understand to obtain even simple data from an atomic force …

Atomic force microscopy (AFM) is in its thirties and has become an invaluable tool for
studying the micro-and nanoworlds. As a stand-alone, high-resolution imaging technique …

In this paper, we will discuss force microscopy (FM) and its potential for determining
mechanical properties of thin films. We will introduce the basic principles of FM, and …

An atomic force microscope (AFM) has been configured so that it measures the force
between a tip mounted on a cantilever beam and a sample surface as a function of the tip …

This article reviews the achievements of both atomic resolution and subnanometer
(molecular) resolution in ambient conditions by atomic force microscopy (AFM). The …