Parallel connection of silicon carbide MOSFETs—Challenges, mechanism, and solutions

H Li, S Zhao, X Wang, L Ding… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Power semiconductor devices are often connected in parallel to increase the current rating
of the power conversion systems. However, due to mismatched circuit parameters or …

Influences of device and circuit mismatches on paralleling silicon carbide MOSFETs

H Li, S Munk-Nielsen, X Wang… - … on Power Electronics, 2015 - ieeexplore.ieee.org
This paper addresses the influences of device and circuit mismatches on paralleling the
silicon carbide (SiC) MOSFETs. Comprehensive theoretical analysis and experimental …

Comprehensive analysis of paralleled sic mosfets current imbalance under asynchronous gate signals

J Wang, C Wang, S Zhao, H Li, L Ding… - IEEE Journal of …, 2023 - ieeexplore.ieee.org
Parallel-connected power device is an extensively applied solution in the industry to
increase the current rating of the converter system. However, due to the undesired printed …

Current sharing and overvoltage issues of paralleled SiC MOSFET modules

K Mainali, J Sabate, S Klopman - 2019 IEEE energy …, 2019 - ieeexplore.ieee.org
The development of the medium voltage wideband gap semiconductor SiC power devices
has enabled several applications. Most of these medium voltage high power applications …

Imbalance current analysis and its suppression methodology for parallel SiC MOSFETs with aid of a differential mode choke

Z Zeng, X Zhang, Z Zhang - IEEE Transactions on Industrial …, 2019 - ieeexplore.ieee.org
Parallel connection of silicon carbide (SiC) MOSFETs is a cost-effective solution for high-
capacity power converters. However, transient imbalance current, during turn-on and-off …

A method to balance dynamic current of paralleled SiC MOSFETs with kelvin connection based on response surface model and nonlinear optimization

C Zhao, L Wang, F Zhang… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Multichip SiC power modules with Kelvin-source connection are popular in applications with
large capacity and high switching frequency. However, dynamic current imbalance among …

Effect of asymmetric layout and unequal junction temperature on current sharing of paralleled SiC MOSFETs with kelvin-source connection

C Zhao, L Wang, F Zhang - IEEE Transactions on Power …, 2019 - ieeexplore.ieee.org
Parallel connection of silicon carbide (SiC) mosfets is a popular solution for high-capacity
applications. In order to improve the switching speed of paralleled SiC mosfets, Kelvin …

A novel DBC layout for current imbalance mitigation in SiC MOSFET multichip power modules

H Li, S Munk-Nielsen, S Bȩczkowski… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This letter proposes a novel direct bonded copper (DBC) layout for mitigating the current
imbalance among the paralleled SiC MOSFET dies in multichip power modules. Compared …

Circuit mismatch and current coupling effect influence on paralleling SiC MOSFETs in multichip power modules

H Li, S Beczkowski, S Munk-Nielsen… - Proceedings of PCIM …, 2015 - ieeexplore.ieee.org
This paper reveals that there are circuit mismatches and a current coupling effect in the
direct bonded copper (DBC) layout of a silicon carbide (SiC) MOSFET multichip power …

Device screening strategy for suppressing current imbalance in parallel-connected SiC MOSFETs

B Zhao, Q Yu, P Sun, Y Cai… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Device parameter mismatch generates current imbalance between parallel devices. In
severe cases, the device that withstands excessive current may incur overcurrent failure …