Atomic force microscopy for nanoscale mechanical property characterization
Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …
technique used primarily for surface topography imaging to one capable of characterizing a …
Nanoscale quantitative mechanical property mapping using peak force tapping atomic force microscopy
SC Minne, Y Hu, S Hu, B Pittenger… - Microscopy and …, 2010 - cambridge.org
The AFM has long been recognized for its ability to either image surfaces at the nanoscale,
or to determine mechanical properties at the nanoscale. However, until recently, the …
or to determine mechanical properties at the nanoscale. However, until recently, the …
Dynamic contact AFM methods for nanomechanical properties
DC Hurley, JP Killgore - Scanning Probe Microscopy in …, 2013 - Wiley Online Library
This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical
characterization: force modulation and contact resonance (CR). It discusses the force …
characterization: force modulation and contact resonance (CR). It discusses the force …
Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach
M Stark, R Guckenberger, A Stemmer… - Journal of Applied …, 2005 - pubs.aip.org
Dynamic atomic force microscopy (AFM) offers many opportunities for the characterization
and manipulation of matter on the nanometer scale with a high temporal resolution. The …
and manipulation of matter on the nanometer scale with a high temporal resolution. The …
Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …
[HTML][HTML] Interaction imaging with amplitude-dependence force spectroscopy
Abstract Knowledge of surface forces is the key to understanding a large number of
processes in fields ranging from physics to material science and biology. The most common …
processes in fields ranging from physics to material science and biology. The most common …
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology, 2012 - iopscience.iop.org
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
Dynamic modes of atomic force microscopy
A Schirmeisen, B Anczykowski, H Hölscher… - … and Nanomechanics I …, 2011 - Springer
This atomic force microscope (AFM) dynamic atomic force microscope (dynamic AFM)
chapter presents an introduction to the concept of the dynamic operational modes of the …
chapter presents an introduction to the concept of the dynamic operational modes of the …
[PDF][PDF] Advanced Atomic force microscopy: Exploring measurements of local electric properties
S Magonov, J Alexander - Application Note, Agilent Technologies, Inc, 2008 - Citeseer
In the past two decades Atomic Force Microscopy (AFM) 1 has been recognized as a
powerful characterization method of surfaces at small scales and in different environments …
powerful characterization method of surfaces at small scales and in different environments …
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy
Detection of dynamic surface displacements associated with local changes in material strain
provides access to a number of phenomena and material properties. Contact resonance …
provides access to a number of phenomena and material properties. Contact resonance …