(57) ABSTRACT An input/output (“I/O) system includes a plurality of input/output (“I/O) ports,
measurement circuitry, and an I/O mul tiplexer bus. The measurement circuitry is coupled to …

Abstract An Extended Input/output (I/O) measurement word facility is provided. Provision is
made for emulation of the Extended I/O measurement word facility. The facility provides for …

System and method for measurement, DAQ, and control operations. A measurement module
includes measurement circuitry for performing Signal conditioning and/or signal conversion …

An embedded s-parameter measurement system for measuring or determining an s-
parameter is provided. The system includes an s-parameter test circuit for connecting to a …

(57) ABSTRACT A method is provided for dynamically determining mea surement
uncertainty (MU) of a measurement device for measuring a signal output by a device under …

A system for making interconnections between an input/output module and a first device and
a second device wherein the system uses standard cables and connectors. The input/output …

A system is provided for testing a first integrated circuit chip associated with at least a
second integrated circuit chip in a semiconductor device, wherein at least some external …

The invention relates to a sensor module, in particular a measured-value pickup (2) for
determining measurement data and a circuit arrangement (3) for enabling a wire-free power …

US7036055B2 - Arrangements for self-measurement of I/O specifications - Google Patents
US7036055B2 - Arrangements for self-measurement of I/O specifications - Google Patents …

(57) ABSTRACT An Input/output (I/O) measurement block facility is pro vided that creates
subchannel measurement blocks (com prising device busy values) related to performance of …