Plasma processing of low-k dielectrics

MR Baklanov, JF de Marneffe, D Shamiryan… - Journal of Applied …, 2013 - pubs.aip.org
This paper presents an in-depth overview of the present status and novel developments in
the field of plasma processing of low dielectric constant (low-k) materials developed for …

Mechanistic study of plasma damage of low k dielectric surfaces

J Bao, H Shi, J Liu, H Huang, PS Ho… - Journal of Vacuum …, 2008 - pubs.aip.org
Plasma damage to low k dielectric materials was investigated from a mechanistic point of
view. Low k dielectric films were treated by Ar, O 2⁠, N 2⁠, N 2∕ H 2⁠, and H 2 plasmas in …

[图书][B] Low pressure plasmas and microstructuring technology

G Franz - 2009 - books.google.com
Over the last forty years, plasma supported processes have attracted ever-creasing interest,
and now, all modern semiconductor devices undergo at least one plasma-involved …

Developments of plasma etching technology for fabricating semiconductor devices

H Abe, M Yoneda, N Fujiwara - Japanese Journal of Applied …, 2008 - iopscience.iop.org
Plasma etching technologies such as reactive ion etching (RIE), isotropic etching, and
ashing/plasma cleaning are the currently used booster technologies for manufacturing all …

Plasma damage mechanisms for low-k porous SiOCH films due to radiation, radicals, and ions in the plasma etching process

S Uchida, S Takashima, M Hori, M Fukasawa… - Journal of Applied …, 2008 - pubs.aip.org
Low dielectric constant (low-k⁠) films have been widely used as insulating materials in ultra-
large-scale integrated circuits. Low-k films receive heavy damage during the plasma …

Effect of plasma interactions with low-κ films as a function of porosity, plasma chemistry, and temperature

MA Worsley, SF Bent, SM Gates, N Fuller… - Journal of Vacuum …, 2005 - pubs.aip.org
Integration of new low-κ interlayer dielectrics (ILD) with current damascene schemes is a
continuing issue in the microelectronics industry. During integration of the ILD, processing …

[图书][B] Handbook of advanced plasma processing techniques

RJ Shul, SJ Pearton - 2011 - books.google.com
Pattern transfer by dry etching and plasma-enhanced chemical vapor de position are two of
the cornerstone techniques for modern integrated cir cuit fabrication. The success of these …

Challenges in the implementation of low-k dielectrics in the back-end of line

R Hoofman, G Verheijden, J Michelon, F Iacopi… - Microelectronic …, 2005 - Elsevier
The introduction of ultra low-k materials in copper technology has been much slower than
anticipated in the ITRS Roadmap. The introduction of porosity in low-k materials has …

Foundations of low-temperature plasma enhanced materials synthesis and etching

GS Oehrlein, S Hamaguchi - Plasma Sources Science and …, 2018 - iopscience.iop.org
Low temperature plasma (LTP)-based synthesis of advanced materials has played a
transformational role in multiple industries, including the semiconductor industry, liquid …

Plasma-etching processes for ULSI semiconductor circuits

M Armacost, PD Hoh, R Wise, W Yan… - IBM journal of …, 1999 - ieeexplore.ieee.org
An overview is presented of plasma-etching processes used in the fabrication of ULSI
(ultralarge-scale integrated) semiconductor circuits, with emphasis on work in our facilities …