GaSb band-structure models for electron density determinations from Raman measurements

MA Ochoa, JE Maslar, HS Bennett - Journal of applied physics, 2023 - pubs.aip.org
We investigate the use of Raman spectroscopy to measure carrier concentrations in n-type
GaSb epilayers to aid in the development of this technique for the nondestructive …

Spectroscopic determination of electron concentration in n-type GaSb

JE Maslar, WS Hurst, CA Wang - Journal of Applied Physics, 2008 - pubs.aip.org
Phonon-plasmon coupled mode Raman spectra of n-type GaSb were measured at room
temperature as a function of electron concentration. These spectra were obtained using an …

Raman spectroscopic determination of hole concentration in p-type GaSb

JE Maslar, WS Hurst, CA Wang - Journal of Applied Physics, 2008 - pubs.aip.org
Phonon-plasmon coupled mode Raman spectra of p-type GaSb were measured at room
temperature as a function of hole concentration. These spectra were obtained using an …

Raman spectroscopy of n-type and p-type GaSb with multiple excitation wavelengths

J Maslar, W Hurst, CA Wang - Applied spectroscopy, 2007 - journals.sagepub.com
The interpretation of Raman spectra of GaSb can be complicated by the presence of a so-
called surface space-charge region (SSCR), resulting in an inhomogeneous near-surface …

Infrared reflectance study of n-type GaSb epitaxial layers

R Ferrini, G Guizzetti, M Patrini, A Bosacchi… - Solid state …, 1997 - Elsevier
Reflectance measurements from 50 to 5000 cm− 1 were made at room temperature on
several GaSb layers grown by molecular beam epitaxy on GaAs substrates, and n-doped …

Electron mobility in GaSb

VWL Chin - Solid-state electronics, 1995 - Elsevier
The effect of carrier concentration and compensation on the electron mobilities in GaSb at
300 and 77 K are investigated. Since the energy of the L band minima relative to the Γ band …

Non-destructive determination of free carrier density of epitaxial layers of GaSb by IR reflectivity measurement

S Schirar, L Bayo, A Melouah, J Bougnot, C Llinares… - Thin solid films, 1987 - Elsevier
IR reflectivity measurements were made on thin epitaxial GaSb layers grown on n+ GaSb
and semi-insulating GaAs substrates. The results were interpreted using a two-oscillator …

Optical functions of bulk and epitaxial GaSb from 0.0025 to 6 eV

M Patrini, G Guizzetti, M Galli, R Ferrini… - Solid state …, 1997 - Elsevier
The complex refraction index and dielectric functions of GaSb bulk (both p and n-type) and
MBE film were accurately determined from 0.0025 to 6 eV by using reflectance and …

[HTML][HTML] Extracting electron densities in n-type GaAs from Raman spectra: theory

HS Bennett - Journal of research of the National Institute of …, 2007 - ncbi.nlm.nih.gov
In this paper, we present the theory for calculating Raman line shapes as functions of the
Fermi energy and finite temperatures in zinc blende, n-type GaAs for donor densities …

Extracting electron densities in n-type GaAs from Raman spectra: Comparisons with Hall measurements

MA Ochoa, JE Maslar, HS Bennett - Journal of applied physics, 2020 - pubs.aip.org
We demonstrate quantitatively how values of electron densities in GaAs extracted from
Raman spectra of two samples depend on models used to describe electric susceptibility …