Test generation for C-testable one-dimensional CMOS ILA's without observable vertical outputs
V Hert, AJ van de Goor - [1992] Proceedings The European …, 1992 - ieeexplore.ieee.org
Sufficient conditions for C-testability of one-dimensional CMOS iterative logic arrays without
vertical outputs are given in the paper. Stuck-open faults in a cell are detected by pairs of …
vertical outputs are given in the paper. Stuck-open faults in a cell are detected by pairs of …