The modulus of elasticity of soft materials on the nanoscale is of interest when studying thin
films, nanocomposites, and biomaterials. Two novel modes of atomic force microscopy …

PeakForce TM quantitative nanomechanical mapping (QNM TM) is a new atomic force
microscopy technique for measuring Young's modulus of materials with high spatial …

Atomic force microscopy (AFM) has proven to be a valuable instrument to characterize
quantitatively the mechanical and morphological properties of soft materials. For medium …

The increasing production of nano-devices and nano-composite materials has prompted the
development of new instruments to probe smaller and smaller volumes. Regarding …

The past two decades have seen atomic force microscopy (AFM) evolve from an
experimental technique to probe simple surface topography to one that can spatially map …

A method that combines high spatial resolution, quantitative and non-destructive mapping of
surfaces and interfaces is a long standing goal in nanoscale microscopy. The method would …

The atomic force microscope (AFM) is used to map the local elastic properties of substrates
by analysis of the force versus tip motion curves. Measurements are presented, which show …

Fast, high-resolution, non-destructive and quantitative characterization methods are needed
to develop materials with tailored properties at the nanoscale or to understand the …

In this Feature Article, we discussed the experimental and modeling methods and analyzed
the limitations of the surface probing of nanomechanical properties of polymeric and …

Finite sample thickness effects on material elasticity measurements made using an atomic
force microscope have been calculated. The model includes an elastic layer on an elastic …