Mueller matrix imaging polarimetry
JL Pezzaniti, RA Chipman - Optical engineering, 1995 - spiedigitallibrary.org
The design and operation of a Mueller matrix imaging polarimeter is presented. The
instrument is configurable to make a wide variety of polarimetric measurements of optical …
instrument is configurable to make a wide variety of polarimetric measurements of optical …
Fabrication, modeling, and characterization of form-birefringent nanostructures
F Xu, RC Tyan, PC Sun, Y Fainman, CC Cheng… - Optics letters, 1995 - opg.optica.org
A 490-nm-deep nanostructure with a period of 200 nm was fabricated in a GaAs substrate by
use of electron-beam lithography and dry-etching techniques. The form birefringence of this …
use of electron-beam lithography and dry-etching techniques. The form birefringence of this …
Linear polarization uniformity measurements taken with an imaging polarimeter
JL Pezzaniti, RA Chipman - Optical Engineering, 1995 - spiedigitallibrary.org
Four types of polarizers are experimentally evaluated and compared for the uniformity of
their transmission axis orientations and the contrast ratio and their spatial variation …
their transmission axis orientations and the contrast ratio and their spatial variation …
Regular geometries for folded optical modules
MP Schamschula, P Reardon, HJ Caulfield… - Applied optics, 1995 - opg.optica.org
We present three new three-dimensional right-cylindrical folded modular interconnection
architectures. To compare these systems among each other and with earlier designs, we …
architectures. To compare these systems among each other and with earlier designs, we …
[引用][C] Effects of diffraction, scatter, and design on the performances of optical information processors
RB Brown, JN Lee - CAMBRIDGE STUDIES IN …, 1995 - Cambridge University Press