An embedded I/sub DDQ/testing architecture and technique
Y Tsiatouhas, T Haniotakis… - … Symposium on Quality …, 2003 - ieeexplore.ieee.org
In this paper an embedded I/sub DDQ/testing architecture is presented that targets to
overcome the excessive hardware overhead requirements in built-in current sensing based …
overcome the excessive hardware overhead requirements in built-in current sensing based …
[PDF][PDF] FAULT DETECTION IN ALGORITHMIC ADC MONITORING DYNAMIC CURRENT IN SI CONVERTERS AND CHARGE IN SC CONVERTERS
Y Lechuga, M Martinez, S Bracho - 161.111.232.132
Fault detection in analog to digital converters is a difficult task that can been enhanced with
the application of Built-in Sensors. The special capability of dynamic current sensors, that …
the application of Built-in Sensors. The special capability of dynamic current sensors, that …