On the evaluation of SEU sensitiveness in SRAM-based FPGAs
The growing adoption of SRAM-based field programmable gate arrays (FPGAs) in safety-
critical applications demands for efficient methodologies for evaluating their reliability …
critical applications demands for efficient methodologies for evaluating their reliability …
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
G Jerke, J Lienig, J Scheible - Proceedings of the 41st Annual Design …, 2004 - dl.acm.org
The negative effect of electromigration on signal and power line lifetime and functional
reliability is an increasingly important problem for the physical design of integrated circuits …
reliability is an increasingly important problem for the physical design of integrated circuits …