[图书][B] Zum Einfluss von Polarisationseffekten in der mikroskopischen Bildentstehung

N Kerwien - 2007 - nbn-resolving.org
Diese Dissertation setzt sich mit Polarisationseffekten in der hochauflösenden bildgebenden
Metrologie auseinander. Sie greift dabei im Kern auf Konzepte der modellbasierten …

Polarization properties of state-of-art lithography optics represented by first canonical coordinate of Lie group

T Fujii, Y Kudo, Y Ohmura, K Suzuki… - Optical …, 2007 - spiedigitallibrary.org
The polarization characteristics of the state-of-art of optical lithography equipment are
approximately ideal, ie, in general only small polarization changes are induced by optical …

Tolerancing and alignment of a three-mirror off-axis telescope

AB Mahler, R Chipman - Optical System Alignment and …, 2007 - spiedigitallibrary.org
When the optical elements of a system are not collinear, there are advantages to aligning all
elements simultaneously. This paper presents the steps taken to prepare for system …

The impact of scanner model vectorization on optical proximity correction

JK Tyminski, T Nakashima, Q Zhang… - Photomask and …, 2007 - spiedigitallibrary.org
Low pass filtering taking place in the projection tools used by IC industry leads to a range of
optical proximity effects resulting in undesired IC characteristics. To correct these predicable …

Subwavelength-grating-induced wavefront aberrations: a case study

K Crabtree, RA Chipman - Applied optics, 2007 - opg.optica.org
The on-axis wavefront aberrations of a one-dimensional subwavelength-grating
antireflection coating on an f/1.7 lens surface are shown to be small with noticeable …

Calculation of polarization aberrations by the method of polarization-wave matrices

AL Sokolov - Optics and Spectroscopy, 2007 - Springer
The technique of calculation of polarization aberrations with the help of the method of
polarizationwave matrices is proposed. Radiation is represented as a coherent set of the …

Scanner-characteristics-aware OPC modeling and correction

JK Tyminski, Q Zhang, K Lucas, L Depre… - Design for …, 2007 - spiedigitallibrary.org
As scanner projection lens captures only a finite number of IC pattern diffraction orders. This
low pass filtering leads to a range of optical proximity effects such as pitch-dependent CD …

РАСЧЕТ ПОЛЯРИЗАЦИОННЫХ АБЕРРАЦИЙ МЕТОДОМ ПОЛЯРИЗАЦИОННО-ВОЛНОВЫХ МАТРИЦ

АЛ Соколов - Оптика и спектроскопия, 2007 - elibrary.ru
Предложена методика расчета поляризационных аберраций с помощью метода
поляризационно-волновых матриц. Излучение представляется когерентной …