relationships between data, information, knowledge, and wisdom. This paper posits that the …
Z He,
Z Peng,
P Eles - 2009 12th Euromicro Conference on …, 2009 - ieeexplore.ieee.org
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …