Microscopic study on the carrier distribution in optoelectronic device structures: experiment and modeling
W Huang, H Xia, S Wang, H Deng… - … and Exhibition (ACP …, 2011 - ieeexplore.ieee.org
Scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy
(SSRM) both are capable of mapping the 2-demensional carrier distribution in …
(SSRM) both are capable of mapping the 2-demensional carrier distribution in …