Pulsed plasma etching for semiconductor manufacturing

DJ Economou - Journal of Physics D: Applied Physics, 2014 - iopscience.iop.org
Power-modulated (pulsed) plasmas have demonstrated several advantages compared to
continuous wave (CW) plasmas. Specifically, pulsed plasmas can result in a higher etching …

Alternative process for thin layer etching: Application to nitride spacer etching stopping on silicon germanium

N Posseme, O Pollet, S Barnola - Applied Physics Letters, 2014 - pubs.aip.org
Silicon nitride spacer etching realization is considered today as one of the most challenging
of the etch process for the new devices realization. For this step, the atomic etch precision to …

MD simulations of low energy Clx+ ions interaction with ultrathin silicon layers for advanced etch processes

P Brichon, E Despiau-Pujo, O Joubert - Journal of Vacuum Science & …, 2014 - pubs.aip.org
Molecular dynamics simulations of low-energy (5–100 eV) Cl+ and Cl 2+ bombardment on
(100) Si surfaces are performed to investigate the impact of plasma dissociation and very …

Pulsed transfer etching of PS–PDMS block copolymers self-assembled in 193 nm lithography stacks

C Girardot, S Böhme, S Archambault… - … applied materials & …, 2014 - ACS Publications
This work presents the graphoepitaxy of high-χ block copolymers (BCP) in standard industry-
like lithography stacks and their transfer into the silicon substrate The process includes …

Time-resolved ion flux, electron temperature and plasma density measurements in a pulsed Ar plasma using a capacitively coupled planar probe

M Darnon, G Cunge… - Plasma Sources Science …, 2014 - iopscience.iop.org
The resurgence of industrial interest in pulsed radiofrequency plasmas for etching
applications highlights the fact that these plasmas are much less well characterized than …

Pulsed Cl2/Ar inductively coupled plasma processing: 0D model versus experiments

E Despiau-Pujo, M Brihoum, P Bodart… - Journal of Physics D …, 2014 - iopscience.iop.org
Comparisons between measurements and spatially-averaged (0D) simulations of low-
pressure Ar and Cl 2 pulsed-plasmas in an industrial inductively coupled reactor are …

Development of plasma etching processes to pattern sub-15 nm features with PS-b-PMMA block copolymer masks: Application to advanced CMOS technology

M Delalande, G Cunge, T Chevolleau… - Journal of Vacuum …, 2014 - pubs.aip.org
The best strategies to transfer nanoholes formed from the self-assembly of Polystyren/
Polymethylmethacrylate (PS/PMMA) based block copolymers into a silicon substrate are …

Phase modulation in pulsed dual-frequency capacitively coupled plasmas

DQ Wen, QZ Zhang, W Jiang, YH Song… - Journal of Applied …, 2014 - pubs.aip.org
Particle-in-cell/Monte Carlo collision simulations, coupled with an external circuit, are used
to investigate the behavior of pulsed dual-frequency (DF) capacitively coupled plasmas …

Patterning of silicon nitride for CMOS gate spacer technology. III. Investigation of synchronously pulsed CH3F/O2/He plasmas

R Blanc, F Leverd, M Darnon, G Cunge… - Journal of Vacuum …, 2014 - pubs.aip.org
Si 3 N 4 spacer etching processes are one of the most critical steps of transistor fabrication
technologies since they must be at the same time very anisotropic to generate straight …

Surface analysis of polysilicon gate etching by pulsed-microwave plasma

M Matsui, M Morimoto, N Ikeda… - Japanese Journal of …, 2014 - iopscience.iop.org
The mechanism of highly selective etching by a pulsed-microwave electron-cyclotron-
resonance plasma was investigated by analyzing surface-reaction layers formed on …