Two-step interpolation algorithm for measurement of longitudinal cracks on pipe strings using circumferential current field testing system

W Li, G Chen, X Yin, W Yang, J Ge - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Pipe strings are critical facilities for well drilling, production, and transportation in oil and gas
industry. Due to the stress corrosion cracking, longitudinal cracks are the most common …

Clustering the dominant defective patterns in semiconductor wafer maps

K Taha, K Salah, PD Yoo - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Identifying defect patterns on wafers is crucial for understanding the root causes and for
attributing such patterns to specific steps in the fabrication process. We propose in this paper …

Optimized state estimation by application of machine learning

C Brecher, M Obdenbusch, M Buchsbaum - Production Engineering, 2017 - Springer
The requirements concerning the technical availability as part of the overall equipment
effectiveness increase constantly in production nowadays. Unplanned downtimes have to …

An effective approach for associating the sources of defect signatures to process zones

K Taha - IEEE Transactions on Semiconductor Manufacturing, 2017 - ieeexplore.ieee.org
A semiconductor wafer undergoes various processing steps before it is transformed from a
plain silicon wafer to one populated with thousands of integrated circuits. Each of these …

Identifying wafer fabrication defect signatures

K Taha - 2017 IEEE International Interconnect Technology …, 2017 - ieeexplore.ieee.org
We introduce a system called IDS for diagnosing semiconductor fabrication process. IDS
can identify the carry-over defect that contributed to a defective cluster captured by an in-line …