Ambit: In-memory accelerator for bulk bitwise operations using commodity DRAM technology

V Seshadri, D Lee, T Mullins, H Hassan… - Proceedings of the 50th …, 2017 - dl.acm.org
Many important applications trigger bulk bitwise operations, ie, bitwise operations on large
bit vectors. In fact, recent works design techniques that exploit fast bulk bitwise operations to …

Error characterization, mitigation, and recovery in flash-memory-based solid-state drives

Y Cai, S Ghose, EF Haratsch, Y Luo… - Proceedings of the …, 2017 - ieeexplore.ieee.org
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …

Understanding reduced-voltage operation in modern DRAM devices: Experimental characterization, analysis, and mechanisms

KK Chang, AG Yağlıkçı, S Ghose, A Agrawal… - Proceedings of the …, 2017 - dl.acm.org
The energy consumption of DRAM is a critical concern in modern computing systems.
Improvements in manufacturing process technology have allowed DRAM vendors to lower …

The RowHammer problem and other issues we may face as memory becomes denser

O Mutlu - Design, Automation & Test in Europe Conference & …, 2017 - ieeexplore.ieee.org
As memory scales down to smaller technology nodes, new failure mechanisms emerge that
threaten its correct operation. If such failure mechanisms are not anticipated and corrected …

The reach profiler (reaper) enabling the mitigation of dram retention failures via profiling at aggressive conditions

M Patel, JS Kim, O Mutlu - ACM SIGARCH Computer Architecture News, 2017 - dl.acm.org
Modern DRAM-based systems suffer from significant energy and latency penalties due to
conservative DRAM refresh standards. Volatile DRAM cells can retain information across a …

Design-induced latency variation in modern DRAM chips: Characterization, analysis, and latency reduction mechanisms

D Lee, S Khan, L Subramanian, S Ghose… - Proceedings of the …, 2017 - dl.acm.org
Variation has been shown to exist across the cells within a modern DRAM chip. Prior work
has studied and exploited several forms of variation, such as manufacturing-process-or …

SoftMC: A flexible and practical open-source infrastructure for enabling experimental DRAM studies

H Hassan, N Vijaykumar, S Khan… - … Symposium on High …, 2017 - ieeexplore.ieee.org
DRAM is the primary technology used for main memory in modern systems. Unfortunately,
as DRAM scales down to smaller technology nodes, it faces key challenges in both data …

Detecting and mitigating data-dependent DRAM failures by exploiting current memory content

S Khan, C Wilkerson, Z Wang, AR Alameldeen… - Proceedings of the 50th …, 2017 - dl.acm.org
DRAM cells in close proximity can fail depending on the data content in neighboring cells.
These failures are called data-dependent failures. Detecting and mitigating these failures …

Utility-based hybrid memory management

Y Li, S Ghose, J Choi, J Sun, H Wang… - … Conference on Cluster …, 2017 - ieeexplore.ieee.org
While the memory footprints of cloud and HPC applications continue to increase,
fundamental issues with DRAM scaling are likely to prevent traditional main memory …

Concurrent data structures for near-memory computing

Z Liu, I Calciu, M Herlihy, O Mutlu - … of the 29th ACM Symposium on …, 2017 - dl.acm.org
The performance gap between memory and CPU has grown exponentially. To bridge this
gap, hardware architects have proposed near-memory computing (also called processing-in …