Quantum engineering of transistors based on 2D materials heterostructures

G Iannaccone, F Bonaccorso, L Colombo… - Nature …, 2018 - nature.com
Quantum engineering entails atom-by-atom design and fabrication of electronic devices.
This innovative technology that unifies materials science and device engineering has been …

A 23.6-Mb/mm SRAM in 10-nm FinFET Technology With Pulsed-pMOS TVC and Stepped-WL for Low-Voltage Applications

Z Guo, D Kim, S Nalam, J Wiedemer… - IEEE Journal of Solid …, 2018 - ieeexplore.ieee.org
A 23.6-Mb/mm 2 and a 20.4-Mb/mm 2 SRAM arrays are manufactured in a 10-nm FinFET
CMOS technology, utilizing high-density 0.0312 μm 2 and low-voltage 0.0367 μm 2 6T …

30-nm contacted gate pitch back-gate carbon nanotube FETs for Sub-3-nm nodes

T Srimani, G Hills, MD Bishop… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
Carbon nanotube FETs (CNFETs) promise significant energy efficiency benefits versus
silicon for digital systems. While these projected benefits are for CNFETs with similar …

Consideration of UFET architecture for the 5 nm node and beyond logic transistor

UK Das, G Eneman, RSR Velampati… - IEEE Journal of the …, 2018 - ieeexplore.ieee.org
In this paper, we propose a trench MOS architecture for the upcoming 5 nm node and
beyond logic transistor. The intended device has a gate formed vertically downward, with …

Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies

D Singh, OD Restrepo, PP Manik… - 2018 IEEE …, 2018 - ieeexplore.ieee.org
We present a hierarchical methodology using a combination of ab-initio phonon scattering,
electron transmission, and multi-scale finite element simulations to accurately model …

Evaluation of predictive technology models

DM Harris, N Wei, Z Wang, A Fikes, A Thaker - Microelectronics journal, 2018 - Elsevier
Researchers lacking access to suitable commercial SPICE models have widely used
predictive technology models (PTMs) for simulation experiments in advanced technologies …

Three‐Dimensional Atomic Force Microscopy for Sidewall Imaging Using Torsional Resonance Mode

L Liu, J Xu, R Zhang, S Wu, X Hu, X Hu - Scanning, 2018 - Wiley Online Library
This article presents an atomic force microscopy (AFM) technique for true three‐dimensional
(3D) characterization. The cantilever probe with flared tip was used in a home‐made 3D …

Work function setting in high-k metal gate devices

E Erben, K Hempel, D Triyoso - Complementary Metal Oxide …, 2018 - books.google.com
As transistor size continues to shrink, SiO2/polysilicon gate stack has been replaced by high-
k/metal gate to enable further scaling. Two different integration approaches have been …

Contact metallization for advanced CMOS technology nodes

V Kamineni, A Carr, C Niu, P Adusumilli… - 2018 IEEE …, 2018 - ieeexplore.ieee.org
Continuous CMOS scaling is being driven by innovation of novel device architectures to
improve device performances at lower power consumption 1. However, middle-of-the-line …

[PDF][PDF] III-V for logic applications: a design perspective

S Sinha, B Cline, G Yeric - csmantech.org
III-V devices have been actively explored for high performance and low power logic
applications to replace silicon in the past decade, mainly owing to their higher intrinsic …