R Chipman, WST Lam, G Young - 2018 - taylorfrancis.com
Polarized Light and Optical Systems presents polarization optics for undergraduate and graduate students in a way which makes classroom teaching relevant to current issues in …
Z Chen, Y Yao, Y Zhu, H Ma - Optics Express, 2018 - opg.optica.org
In this paper we report a method for removing artifacts caused by the beam splitter in a collinear backscattering Mueller matrix (CBMM) imaging system. As an essential optical …
S Shrestha, A Deshpande, T Farrahi, T Cambria… - … Signal Processing and …, 2018 - Elsevier
In this article, we explore the potential of an original label-free Near-Infrared (NIR) imaging technique, based on Mueller Matrix decomposition reflectance, for efficient detection and …
Polarimetric measurements are becoming increasingly accurate and fast to perform in modern applications. However, analysis on the polarimetric data usually suffers from its high …
Y Quéau, F Leporcq, A Alfalou - Optics Letters, 2018 - opg.optica.org
This study is concerned with the design of a Mueller imaging polarimeter for the visualization of spatially varying Mueller matrix fields. A simplified calibration procedure is advocated …
G Capobianco, M Casti, S Fineschi… - Space Telescopes …, 2018 - spiedigitallibrary.org
Metis is an inverted occulted coronagraph on-board the ESA/Solar Orbiter mission. The visible light path of the instrument will observe the" white" light (580-640 nm) linearly …
SA Nouri, DA Gregory, K Fuller - Journal of Quantitative Spectroscopy and …, 2018 - Elsevier
A fixed-angle spectropolarimeter capable of measuring the Mueller matrix of particle deposits and conventional optical elements over the 300–1100 nm spectral range has been …
Z Chen, Y Yao, Y Zhu, H Ma - Optical Biopsy XVI: Toward …, 2018 - spiedigitallibrary.org
In a recent attempt, we developed a colinear backscattering Mueller matrix microscope by adding polarization state generator (PSG) and polarization state analyzer (PSA) into the …
MH Smith, Y Zou - US Patent 9,989,454, 2018 - Google Patents
Methods and systems are provided to measure the optical anisotropy properties of a film on glass or other substrates. This technique is suitable for production environments, and is not …