A physics-based model for LER-induced threshold voltage variations in double-gate MOSFET

[引用][C] Impact of Variability on Novel Transistor Configurations in Adder Circuits at 7nm FinFET Technology

U Mushtaq, MW Akram, D Prasad, A Islam… - Journal of Circuits …, 2024 - World Scientific
This research work focuses on implementation of the FinFET-based complementary metal-
oxide-semiconductor (CMOS) Full Adder circuits for different transistor configurations using …
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