This paper presents a new approach for detecting defects in analog integrated circuits using
the feed-forward neural network trained by the resilient error back-propagation method. A …

In this paper, on-chip test circuitry performing the transient supply current measurement is
presented. The introduced principle makes uses of the parasitic resistance of the supply …

A new parametric approach for detecting defects in analog integrated circuits using the feed
forward neural network trained by back-propagation method is presented. The neural …

Test circuitry and test methods performing supply current measurement is presented. The
test circuitry can be but is not limited to be on-chip. The supply current, also denoted test …

I/sub DDQ/testing is a powerful strategy for detecting defects that do not alter the logic
behavior of CMOS ICs. Such a technique is very effective especially in the detection of …

An exhaustive classification of bridging faults between pairs of logic level circuit nodes and
an I/sub DDQ/testability analysis scheme for these faults are presented in this paper. The …

We analyze a transient current testing technique that measures and computes the charge
delivered to the circuit during the transient operation. The method was applied to 0.5/spl …

El artículo presenta una serie de especies no aptas para la arborización urbana en la
ciudad de Montería, Colombia, y además, algunas especies nativas e introducidas cuyo uso …

Anomalous BGP events can deteriorate Internet performance and connectivity thus have
always been a research topic. However, most measurement works in this realm are prone to …

The paper presents an algorithm for parametric fault diagnosis of nonlinear analog circuits.
A power supply current waveform I DD is used as an indicator of a device feature. A test …