G Rezazadeh - Microsystem Technologies, 2008 - Springer
A novel model to study the pull-in behavior of nonlinear electromechanically coupled systems has been developed. The proposed model is based on the multilayered cantilever …
Based on the first resonance frequency measurement of multilayer beams, a simple extraction method has been developed to extract the Young's modulus of individual layers …
S Kamiya, JH Kuypers, A Trautmann… - Journal of …, 2007 - ieeexplore.ieee.org
A new test structure was developed to measure three major unknown mechanical parameters of deposited thin films, ie, fracture strength, Young's modulus, and residual …
YG Wang, WH Lin, ZJ Feng, XM Li - International Journal of Mechanical …, 2012 - Elsevier
This paper presents an analysis of the pull-in instability and vibrational behaviors for a multi- layer microbeam actuated electrostatically. Based on the accurate geometrically nonlinear …
T Ikehara, RAF Zwijze, K Ikeda - Journal of micromechanics and …, 2001 - iopscience.iop.org
The residual strain of polycrystalline silicon (poly-Si) film is evaluated using the strain- sensitive nature of the resonant frequency of a doubly-supported beam. By introducing the …
H Liu, Z Zhang, H Gao, L Zhang, L Wang - Micromachines, 2022 - mdpi.com
This paper presents a simple method for the in situ determination of Young's moduli of surface-micromachined bilayer thin films. The test structure consists of a cantilever, a bottom …
An electromechanical model for a transducer based on a lateral resonating cantilever is described. The on-plane vibrations of the cantilever are excited electrostatically by applying …
B Mi, DA Smith, H Kahn, FL Merat… - Journal of …, 2005 - ieeexplore.ieee.org
A novel digitally-actuated shaped micromirror for on-off optical switch applications is described. Reflective static spherical mirrors were designed and fabricated using …
S Román-Sánchez, A Moure, A del Campo, I Lorite… - Measurement, 2024 - Elsevier
The deconvolution of the thermal and mechanical stress and other induced effects caused by the electrical current flowing through a semiconductor-based device is often quite …