An analytical model for pull-in voltage of clamped–clamped multilayer beams

H Rong, QA Huang, M Nie, W Li - Sensors and Actuators A: Physical, 2004 - Elsevier
This paper develops an analytical model for the deflection of clamped–clamped multilayer
beams as a function of applied voltage by the energy method. The normalized displacement …

A comprehensive model to study nonlinear behavior of multilayered micro beam switches

G Rezazadeh - Microsystem Technologies, 2008 - Springer
A novel model to study the pull-in behavior of nonlinear electromechanically coupled
systems has been developed. The proposed model is based on the multilayered cantilever …

A simple extraction method of Young's modulus for multilayer films in MEMS applications

XG Guo, ZF Zhou, C Sun, WH Li, QA Huang - Micromachines, 2017 - mdpi.com
Based on the first resonance frequency measurement of multilayer beams, a simple
extraction method has been developed to extract the Young's modulus of individual layers …

Process temperature–dependent mechanical properties of polysilicon measured using a novel tensile test structure

S Kamiya, JH Kuypers, A Trautmann… - Journal of …, 2007 - ieeexplore.ieee.org
A new test structure was developed to measure three major unknown mechanical
parameters of deposited thin films, ie, fracture strength, Young's modulus, and residual …

Characterization of extensional multi-layer microbeams in pull-in phenomenon and vibrations

YG Wang, WH Lin, ZJ Feng, XM Li - International Journal of Mechanical …, 2012 - Elsevier
This paper presents an analysis of the pull-in instability and vibrational behaviors for a multi-
layer microbeam actuated electrostatically. Based on the accurate geometrically nonlinear …

New method for an accurate determination of residual strain in polycrystalline silicon films by analysing resonant frequencies of micromachined beams

T Ikehara, RAF Zwijze, K Ikeda - Journal of micromechanics and …, 2001 - iopscience.iop.org
The residual strain of polycrystalline silicon (poly-Si) film is evaluated using the strain-
sensitive nature of the resonant frequency of a doubly-supported beam. By introducing the …

A simple method for the measurement of Young's moduli of bilayer thin films based on the electrostatic drive approach

H Liu, Z Zhang, H Gao, L Zhang, L Wang - Micromachines, 2022 - mdpi.com
This paper presents a simple method for the in situ determination of Young's moduli of
surface-micromachined bilayer thin films. The test structure consists of a cantilever, a bottom …

On the electromechanical modelling of a resonating nano-cantilever-based transducer

J Teva, G Abadal, ZJ Davis, J Verd, X Borrisé, A Boisen… - Ultramicroscopy, 2004 - Elsevier
An electromechanical model for a transducer based on a lateral resonating cantilever is
described. The on-plane vibrations of the cantilever are excited electrostatically by applying …

Static and electrically actuated shaped MEMS mirrors

B Mi, DA Smith, H Kahn, FL Merat… - Journal of …, 2005 - ieeexplore.ieee.org
A novel digitally-actuated shaped micromirror for on-off optical switch applications is
described. Reflective static spherical mirrors were designed and fabricated using …

[HTML][HTML] Assessment of thermo-mechanical phenomena in Si-based diodes via operando confocal Raman microscopy

S Román-Sánchez, A Moure, A del Campo, I Lorite… - Measurement, 2024 - Elsevier
The deconvolution of the thermal and mechanical stress and other induced effects caused
by the electrical current flowing through a semiconductor-based device is often quite …