Circuit monitoring techniques have been adopted widely to compensate for process,
voltage, and temperature variations as well as power optimization of integrated circuits. For …

Process variation occurring during fabrication of complex VLSI devices induce uncertainties
in operation parameters (eg, supply voltage) to be applied to each device in order for it to fit …

To overcome the increasing sensitivity to variability in nanoscale integrated circuits,
operation parameters (eg, supply voltage) are adapted in a customized way exclusively to …

Improving energy efficiency has always been the prime objective of the custom and
automated digital circuit design techniques. As a result, a multitude of methods to reduce …

Adaptive voltage scaling (AVS) has been used widely to compensate for process, voltage,
and temperature variations as well as power optimization of integrated circuits. The current …

In this paper, we propose using transition fault test patterns to perform adaptive voltage
scaling (AVS) as a low-cost alternative to process monitoring boxes (PMBs) while improving …

Random variation is one of the important components that contribute into core-speed
discrepancy. In the paper, a novel technique is proposed that uses footer transistors to …

With the continued down-scaling of IC technology and increase in manufacturing process
variations, it is becoming ever more difficult to accurately estimate circuit performance of …

Application of manufacturing testing during the production process of integrated circuits is
considered essential to ensure the quality of the devices used in the field. However, it is …