Surface chemistry of prototypical bulk II− VI and III− V semiconductors and implications for chemical sensing

F Seker, K Meeker, TF Kuech, AB Ellis - Chemical reviews, 2000 - ACS Publications
Bulk II-VI and III-V single-crystal semiconductors provide an appealing coupling of chemical,
electrical, and optical properties that can be exploited in the design of chemical sensors. The …

Chalcogenide passivation of III–V semiconductor surfaces

VN Bessolov, MV Lebedev - Semiconductors, 1998 - Springer
Experimental studies of chalcogenide passivation (by sulfur and selenium atoms) of III–V
semiconductor surfaces are analyzed. The characteristic features of chemical-bond …

Theory of semiconductor surface reconstruction

GP Srivastava - Reports on Progress in Physics, 1997 - iopscience.iop.org
We present a review of semiconductor surface reconstruction. Experimental and theoretical
results on atomic geometry, electronic states, phonon modes, and bonding are presented for …

Reactivity of surface sites on fractured arsenopyrite (FeAsS) toward oxygen

AG Schaufuss, HW Nesbitt, MJ Scaini… - American …, 2000 - pubs.geoscienceworld.org
The reactivity of arsenopyrite (FeAsS) fractured surfaces toward oxygen was studied using
synchrotron radiation excited photoelectron spectroscopy (SXPS). The spectra of the pristine …

Identification and thermal stability of the native oxides on InGaAs using synchrotron radiation based photoemission

B Brennan, G Hughes - Journal of Applied Physics, 2010 - pubs.aip.org
A high resolution synchrotron radiation core level photoemission study of the native oxides
on In 0.53 Ga 0.47 As was carried out in order to determine the various oxidation states …

Optimisation of the ammonium sulphide (NH4) 2S passivation process on In0. 53Ga0. 47As

B Brennan, M Milojevic, CL Hinkle… - Applied surface …, 2011 - Elsevier
The passivation of III–V semiconductor materials with sulphur is widely reported to reduce
interface state defects and improve semiconductor device performance. The most common …

[PDF][PDF] Халькогенидная пассивация поверхности полупроводников А3В5

ВН Бессолов, МВ Лебедев - Физика и техника полупроводников, 1998 - journals.ioffe.ru
Проведен анализ работ, посвященных халькогенидной пассивации (атомами серы и
селена) поверхности полупроводников AIIIBV. Рассмотрены особенности …

Nitrogen-vacancy-related defects and Fermi level pinning in n-GaN Schottky diodes

YJ Lin, CY Ho, HC Chang, FT Chien - Journal of Applied Physics, 2003 - pubs.aip.org
The relationship between the surface states related to nitrogen-vacancy defects and surface
Fermi level pinning has been investigated using x-ray photoelectron spectroscopy and …

Schottky barrier height and surface state density of Ni/Au contacts to -treated n-type GaN

CT Lee, YJ Lin, DS Liu - Applied Physics Letters, 2001 - pubs.aip.org
By using capacitance–voltage and photoluminescence measurements, we have
investigated the Schottky barrier height and surface state density of Ni/Au contacts to n-type …

Surface modification of III–V semiconductors: chemical processes and electronic properties

MV Lebedev - Progress in surface science, 2002 - Elsevier
The possibilities of controlling the surface electronic properties of III–V semiconductors by
varying the adsorption chemistry are analyzed. Variations of the adsorption process …