[HTML][HTML] Simulation Environment for the Testing of Electrical Arc Fault Detection Algorithms
Electrical arc fault detector development requires many tests to develop and validate
detection algorithms. The use of artificial intelligence or mathematical transformation …
detection algorithms. The use of artificial intelligence or mathematical transformation …
Method for reconstructing fault arc current signals and an adaptive correction strategy
J Huang, Z Xu, L Du - Chinese Journal of Electrical …, 2024 - ieeexplore.ieee.org
A reconstruction method using experimental arc fault data to improve the testing efficiency of
protection devices is introduced. By establishing an arc-current database and employing …
protection devices is introduced. By establishing an arc-current database and employing …
Detection performance of arcing fault detectors in the Chinese market according to the Chinese Standard GB/T 31143
Z Huang, C Jia, Z Li, Y Du, QS Cheng… - Journal of Physics …, 2024 - iopscience.iop.org
There are two sets of standards available in the Chinese market that specify the design
requirements and operating tests for arc fault detection devices (GB/T 31143) and arcing …
requirements and operating tests for arc fault detection devices (GB/T 31143) and arcing …
Contributions to the Electrical Safety Knowledge Base in 2023 [Electrical Safety]
DR Doan - IEEE Industry Applications Magazine, 2024 - ieeexplore.ieee.org
Committees within the IEEE Industry Applications Society (IAS) make many technical
contributions to the IEEE knowledge base on electrical safety. An IEEE Xplore search of the …
contributions to the IEEE knowledge base on electrical safety. An IEEE Xplore search of the …
[引用][C] Electrical Safety Workshop (ESW); the Electrical Safety Committee invited the authors to submit a technical paper for peer review.●“Substation Safety
S Safety - ieeexplore.ieee.org
[1] Z. Li et al.,“Ground potential distribution and human-body touch voltage in old residential
communities,” IEEE Trans. Ind. Appl., vol. 59, no. 4, pp. 4980–4989, Jul./Aug. 2023, doi …
communities,” IEEE Trans. Ind. Appl., vol. 59, no. 4, pp. 4980–4989, Jul./Aug. 2023, doi …