T/R Switch Composed of Three HV-MOSFETs With 12.1-μW Consumption That Enables Per-Channel Self-Loopback AC Tests and− 18.1-dB Switching Noise …
S Kajiyama, Y Igarashi, T Yazaki… - … Transactions on Very …, 2021 - ieeexplore.ieee.org
This article presents an area-and power-efficient transmission/receiving (TX/RX)-isolation
switch implemented in a 3072-ch ultrasound (US) in-probe 2-D array transceiver application …
switch implemented in a 3072-ch ultrasound (US) in-probe 2-D array transceiver application …
Imbalance-based self-test for high-speed mixed-signal embedded systems
B Kim, JA Abraham - … Transactions on Circuits and Systems II …, 2012 - ieeexplore.ieee.org
Precisely measuring specifications of differential analog and mixed-signal circuits is a
difficult problem for self-test development because the imbalance introduced by the design …
difficult problem for self-test development because the imbalance introduced by the design …
Designing nonlinearity characterization for mixed-signal circuits in system-on-chip
B Kim, JA Abraham - Analog Integrated Circuits and Signal Processing, 2015 - Springer
Long test times and the use of conventional automatic test equipment (ATE) makes
conventional mixed-signal linearity performance testing costly. Diminishing test time of …
conventional mixed-signal linearity performance testing costly. Diminishing test time of …
Bitstream-driven built-in characterization for analog and mixed-signal embedded circuits
B Kim, JA Abraham - … Transactions on Circuits and Systems II …, 2014 - ieeexplore.ieee.org
The conventional analog and mixed-signal production testing of system-on-a-chip systems
provides limited controllability and observability because automatic test equipment (ATE) …
provides limited controllability and observability because automatic test equipment (ATE) …
Capacitor-coupled built-off self-test in analog and mixed-signal embedded systems
B Kim, JA Abraham - … Transactions on Circuits and Systems II …, 2013 - ieeexplore.ieee.org
Design-for-test (DfT) circuitry that employs differential terminals inherently suffers from an
imbalance in the output of its differential pair. By providing the imbalanced differential test …
imbalance in the output of its differential pair. By providing the imbalanced differential test …
Dynamic performance characterization of embedded single-ended mixed-signal circuits
B Kim, JA Abraham - … Transactions on Circuits and Systems II …, 2014 - ieeexplore.ieee.org
The inherent fault-masking characteristic of the traditional loopback test produces overly
pessimistic estimates of device-under-test (DUT) performance, which negatively impacts …
pessimistic estimates of device-under-test (DUT) performance, which negatively impacts …