System-level test (SLT) is gaining in importance in modern test flows. This paper
summarizes recent industrial findings from three companies and discusses some of the still …

With the continued success of the open RISC-V architecture, practical deployment of RISC-V
processors necessitates an in-depth consideration of their testability, safety and security …

The Intel Data Center Diagnostics Tool (DCDIAGS) is a suite of tests for screening defects
that may cause silent data errors. We analyzed individual DCDIAGS tests to understand their …

Throughout device testing, one key parameter to be considered is the switching activity
(SWA) of the circuit under test (CUT). To avoid unwanted scenarios due to excessive power …

Complexity and performance of Automotive System-on-Chips have exponentially grown in
the last decade, also according to technology advancements. Unfortunately, this trend …

There has been speculation that the source of many of the unpredictable and hard to
diagnose intermittent errors being increasingly observed in operation are timing …

During device testing, an important parameter to be considered by the test engineers is the
switching activity (SWA) of the circuit under test (CUT). It is well known that the SWA must be …

The testing of integrated circuits is an important topic, particularly in safety-critical
applications. This is especially true for microcontrollers (MCUs) used in the automotive …

During device testing, one of the aspects to be considered is the minimization of the
switching activity of the circuit under test in order to steer clear of introducing problems due …

This paper deals with functional System-Level Test (SLT) for System-on-Chips (SoCs)
communication peripherals. The proposed methodology is based on analyzing the potential …