A review of data mining applications in semiconductor manufacturing

P Espadinha-Cruz, R Godina, EMG Rodrigues - Processes, 2021 - mdpi.com
For decades, industrial companies have been collecting and storing high amounts of data
with the aim of better controlling and managing their processes. However, this vast amount …

A review of data mining with big data towards its applications in the electronics industry

S Lv, H Kim, B Zheng, H Jin - Applied Sciences, 2018 - mdpi.com
Featured Application This review not only benefits researchers to develop strong research
themes and identify gaps in the field but also helps practitioners for DM and Big Data …

A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems

HW Xu, QH Zhang, YN Sun, QL Chen, W Qin… - Journal of Manufacturing …, 2024 - Elsevier
Abstracts Wafer yield is crucial for assessing semiconductor fabrication enterprises' stability
and technological maturity. Quickly achieving the yield ramp-up of new products and timely …

A knowledge discovery in databases approach for industrial microgrid planning

C Gamarra, JM Guerrero, E Montero - Renewable and Sustainable Energy …, 2016 - Elsevier
The progressive application of Information and Communication Technologies to industrial
processes has increased the amount of data gathered by manufacturing companies during …

Using data mining methods to develop manufacturing production rule in IoT environment

L Wang, B Lin, R Chen, KH Lu - The Journal of Supercomputing, 2022 - Springer
In order to meet the needs of customers in an Internet of Things (IoT) environment, the
traditional manufacturing production strategy has gradually shifted from mass production to …

An adaptive Copula function-based framework for fault detection in semiconductor wafer fabrication

HW Xu, W Qin, YN Sun, YL Lv, J Zhang - Computers & Industrial …, 2024 - Elsevier
Wafer fabrication is a complex manufacturing system. Timely identification of the key
influencing factors associated with the cause of defects is critical to wafer yield …

Data analysis using multidimensional modeling, statistical analysis and data mining on agriculture parameters

S Hira, PS Deshpande - Procedia Computer Science, 2015 - Elsevier
Generation of agriculture data has increased over past years to judge impact of agriculture
parameters to make action plan and to examine agriculture productivity. This data is …

Combining an automatic material handling system with lean production to improve outgoing quality assurance in a semiconductor foundry

JJ Lyu, PS Chen, WT Huang - Production Planning & Control, 2021 - Taylor & Francis
This research uses a case study methodology to investigate ways of improving the outgoing
quality assurance (OQA) processes of a 12-inch wafer foundry. It applies the value stream …

A Copula network deconvolution-based direct correlation disentangling framework for explainable fault detection in semiconductor wafer fabrication

HW Xu, W Qin, JH Hu, YN Sun, YL Lv… - Advanced Engineering …, 2024 - Elsevier
Wafer fabrication is a highly complex manufacturing system. Using complex network models
to portray the correlation between parameters is an effective tool for finding the key …

A data-driven approach for identifying possible manufacturing processes and production parameters that cause product defects: A thin-film filter company case study

J Lyu, CW Liang, PS Chen - Ieee Access, 2020 - ieeexplore.ieee.org
A semiconductor or photoelectric manufacturer faces a more competitive market with small
quantities of many products. These products require hundreds of processes for production …