R Brixtel, S Bougleux, O Lézoray, Y Caillot… - IEEE …, 2022 - ieeexplore.ieee.org
With the advent of whole slide image (WSI) scanners, pathology is undergoing a digital revolution. Simultaneously, with the development of image analysis algorithms based on …
When designing a diagnostic model for a clinical application, it is crucial to guarantee the robustness of the model with respect to a wide range of image corruptions. Herein, an easy …
The problem of artifacts in whole slide image acquisition, prevalent in both clinical workflows and research-oriented settings, necessitates human intervention and re-scanning …
The production of pathological slides is a complex task requiring several physical and chemical procedures that are often done manually. Occasionally, such procedures may end …
I Irmakci, R Nateghi, R Zhou, M Vescovo, M Saft… - Modern Pathology, 2024 - Elsevier
Machine learning (ML) models are poised to transform surgical pathology practice. The most successful use attention mechanisms to examine whole slides, identify which areas of tissue …
C Wang, Z He, J He, J Ye, Y Shen - International Conference on Artificial …, 2024 - Springer
Histology whole slide images (WSIs) are extensively used in tumor diagnosis and treatment planning. However, the presence of artifacts resulting from improper operations during WSI …
G Raipuria, N Singhal - Medical Imaging with Deep Learning, 2022 - openreview.net
Artifacts on digitized Whole Slide Images like blur, tissue fold, and foreign particles have been demonstrated to degrade the performance of deep convolutional neural networks …
This literature review explores the vital role of both classic and intelligent software testing in ensuring the quality and safety of medical software. Classic approaches establish a solid …
Z He, W Liu, M Yin, K Han - MICCAI Workshop on Deep Generative …, 2024 - Springer
Histological artifacts pose challenges for both pathologists and Computer-Aided Diagnosis (CAD) systems, leading to errors in analysis. Current approaches for histological artifact …