Adaptations of data mining methodologies: A systematic literature review

V Plotnikova, M Dumas, F Milani - PeerJ Computer Science, 2020 - peerj.com
The use of end-to-end data mining methodologies such as CRISP-DM, KDD process, and
SEMMA has grown substantially over the past decade. However, little is known as to how …

Data-driven methods for batch data analysis–A critical overview and mapping on the complexity scale

R Rendall, LH Chiang, MS Reis - Computers & Chemical Engineering, 2019 - Elsevier
More than two decades have passed since the first holistic data-driven approaches for batch
data analysis (BDA) were published. The emphasis was on multivariate statistical process …

Towards artificial intelligence at scale in the chemical industry

LH Chiang, B Braun, Z Wang, I Castillo - AIChE Journal, 2022 - Wiley Online Library
Abstract In the Industry 4.0 era, the chemical industry is embracing broad adoption of
artificial intelligence (AI) and machine learning (ML) methods. This article provides a holistic …

Assessing the value of information of data‐centric activities in the chemical processing industry 4.0

MS Reis, R Kenett - AIChE Journal, 2018 - Wiley Online Library
The quality of information generated in data‐driven empirical studies is of central importance
in Industry 4.0. However, despite the undeniable and widely accepted importance, not …

Feature space monitoring for smart manufacturing via statistics pattern analysis

QP He, J Wang, D Shah - Computers & Chemical Engineering, 2019 - Elsevier
Statistical process monitoring (SPM) is an important component in the long-term reliable
operation of any system and its importance can only become greater in the era of smart …

[HTML][HTML] A functional data-driven approach to monitor and analyze equipment degradation in multiproduct batch processes

J Sansana, R Rendall, MN Joswiak, I Castillo… - Process Safety and …, 2023 - Elsevier
Equipment degradation is ubiquitous in the Chemical Process Industry (CPI), causing
significant losses in efficiency, controllability, and plant economy, as well as an increased …

Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework

K Suthar, D Shah, J Wang, QP He - Computers & Chemical Engineering, 2019 - Elsevier
In semiconductor manufacturing, virtual metrology (VM), also known as soft sensor, is the
prediction of wafer properties using process variables and other information available for the …

Comparative study on wavelet functional partial least squares soft sensor for complex batch processes

J Liu, D Sun, J Chen - Chemical Engineering Science, 2022 - Elsevier
Conventional data-driven models for batch processes conduct unfolding operations and
neglect the continuous property. A novel soft sensor method is proposed based on the …

[HTML][HTML] Data-driven process system engineering–contributions to its consolidation following the path laid down by George Stephanopoulos

MS Reis, PM Saraiva - Computers & Chemical Engineering, 2022 - Elsevier
The number and diversity of Process Analytics applications is growing fast, impacting areas
ranging from process operations to strategic planning or supply chain management …

Monitoring batch processes with dynamic time warping and k-nearest neighbours

M Spooner, M Kulahci - Chemometrics and Intelligent Laboratory Systems, 2018 - Elsevier
A novel data driven approach to batch process monitoring is presented, which combines the
k-Nearest Neighbour rule with the dynamic time warping (DTW) distance. This online …