Mechanism for growth initiation on aminosilane-functionalized SiO2 during area-selective atomic layer deposition of ZrO2

W Xu, PC Lemaire, K Sharma, RJ Gasvoda… - Journal of Vacuum …, 2021 - pubs.aip.org
The mechanism for growth initiation on the nongrowth surface during area-selective atomic
layer deposition (ALD) processes is not well understood. In this study, we examine the ALD …

Surface reaction mechanisms during atomic layer deposition of zirconium oxide using water, ethanol, and water-ethanol mixture as the oxygen sources

W Xu, PC Lemaire, K Sharma, DM Hausmann… - Journal of Vacuum …, 2020 - pubs.aip.org
The authors have investigated the surface reaction mechanisms during the atomic layer
deposition (ALD) of ZrO 2 from tetrakis (ethylmethylamino) zirconium (TEMAZ) with H 2 O, C …

Room-temperature atomic layer deposition of ZrO2 using tetrakis (ethylmethylamino) zirconium and plasma-excited humidified argon

K Kanomata, K Tokoro, T Imai, P Pansila, M Miura… - Applied Surface …, 2016 - Elsevier
Room-temperature atomic layer deposition (ALD) of ZrO 2 is developed with tetrakis
(ethylmethylamino) zirconium (TEMAZ) and a plasma-excited humidified argon. A growth …

Room-temperature plasma-enhanced atomic layer deposition of ZnO: Film growth dependence on the PEALD reactor configuration

M Napari, M Lahtinen, A Veselov, J Julin… - Surface and Coatings …, 2017 - Elsevier
Room-temperature plasma-enhanced atomic layer deposition (PEALD) of ZnO was studied
by depositing the films using diethylzinc and O 2 plasma from inductively-coupled plasma …

Comparison of HfCl4, HfI4, TEMA-Hf, and TDMA-Hf as precursors in early growing stages of HfO2 films deposited by ALD: A DFT study

M Cortez-Valadez, C Fierro, JR Farias-Mancilla… - Chemical Physics, 2016 - Elsevier
The final structure of HfO 2 films grown by atomic layer deposition (ALD) after reaction with
OH− ions has been analyzed by DFT (density functional theory). The interaction of the …

Al2O3 Thin Films Prepared by a Combined Thermal‐Plasma Atomic Layer Deposition Process at Low Temperature for Encapsulation Applications

Z Zhu, S Merdes, OME Ylivaara… - … status solidi (a), 2020 - Wiley Online Library
In this article, a combined H2O thermal atomic layer deposition of Al2O3 with in situ N2
plasma treatment process at 90° C for encapsulation applications is reported. The effect of …

Al2O3 Thin Films Prepared by a Combined Thermal‐Plasma Atomic Layer Deposition Process at Low Temperature for Encapsulation Applications.

Z Zhu, S Merdes, OME Ylivaara… - … Status Solidi. A …, 2020 - search.ebscohost.com
In this article, a combined H2O thermal atomic layer deposition of Al2O3 with in situ N2
plasma treatment process at 90 C for encapsulation applications is reported. The effect of …

Low-temperature thermal and plasma-enhanced atomic layer deposition of metal oxide thin films

M Napari - 2017 - jyx.jyu.fi
DEPARTMENT OF PHYSICS UNIVERSITY OF JYVÄSKYLÄ RESEARCH REPORT No. 4/2017
LOW-TEMPERATURE THERMAL AND PLASMA-ENHANCED ATOMIC LA Page 1 …

[PDF][PDF] Atomic layer deposition and immobilised molecular catalysts studied by in and ex situ electron spectroscopy

P Shayesteh - 2019 - portal.research.lu.se
The research work that I describe in my thesis deals with three different heterogenisation
approaches for synthesising a heterogeneous transition metal catalyst used for direct CH …

Room-Temperature Atomic Layer Deposition: a Review

F Hirose - 2023 21st International Workshop on Junction …, 2023 - ieeexplore.ieee.org
Atomic layer deposition (ALD) has become an indispensable technology for the production
of ultra-large-scale integration, since it allows for metal oxide stacking with an atomic-level …