Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films

AG Korpi, Ş Ţălu, M Bramowicz, A Arman… - Materials Research …, 2019 - iopscience.iop.org
The aim of this study is to gain a deeper understanding of the micromorphology
characteristics of thin titanium nitride (TiN) films sputtered on glass substrates by using ion …

LaTiOxNy Thin Film Model Systems for Photocatalytic Water Splitting: Physicochemical Evolution of the Solid–Liquid Interface and the Role of the Crystallographic …

M Pichler, W Si, F Haydous, H Téllez… - Advanced functional …, 2017 - Wiley Online Library
The size of the band gap and the energy position of the band edges make several oxynitride
semiconductors promising candidates for efficient hydrogen and oxygen production under …

X-ray photoelectron spectroscopy analysis of zirconium nitride-like films prepared on Si (100) substrates by ion beam assisted deposition

M Matsuoka, S Isotani, W Sucasaire, N Kuratani… - Surface and Coatings …, 2008 - Elsevier
Thin zirconium nitride films were prepared on Si (100) substrates at room temperature by ion
beam assisted deposition with a 2 keV nitrogen ion beam. Arrival rate ratios ARR (N/Zr) …

Characterization of titanium oxynitride films deposited by low pressure chemical vapor deposition using amide Ti precursor

X Song, D Gopireddy, CG Takoudis - Thin Solid Films, 2008 - Elsevier
In this study, we investigate the use of an amide-based Ti-containing precursor, namely
tetrakis (diethylamido) titanium (TDEAT), for TiNxOy film deposition at low temperature …

[HTML][HTML] X-ray photoelectron spectroscopy and Raman spectroscopy studies on thin carbon nitride films deposited by reactive RF magnetron sputtering

M Matsuoka, S Isotani, RD Mansano… - World Journal of Nano …, 2012 - scirp.org
Thin carbon nitride (CNx) films were synthesized on silicon substrates by reactive RF
magnetron sputtering of a graphite target in mixed N2/Ar discharges and the N2 gas fraction …

[HTML][HTML] Chemical bonding and composition of silicon nitride films prepared by inductively coupled plasma chemical vapor deposition

M Matsuoka, S Isotani, W Sucasaire… - Surface and Coatings …, 2010 - Elsevier
Thin silicon nitride films were prepared at 350° C by inductively coupled plasma chemical
vapor deposition on Si (100) substrates under different NH3/SiH4 or N2/SiH4 gas mixture …

Etching characteristics of TiN used as hard mask in dielectric etch process

M Darnon, T Chevolleau, D Eon, L Vallier… - Journal of Vacuum …, 2006 - pubs.aip.org
This study focuses on the etching characteristics of a TiN hard mask in terms of etch rate and
faceting when using a dielectric etch process. The etching experiments have been …

Air-based sputtering deposition of TiNxOy films for solar selective absorber coatings applications

YC Liou, FH Lu - Thin Solid Films, 2018 - Elsevier
Titanium oxynitride (TiN x O y) thin films with tunable electrical and optical properties were
produced by sputtering using air as a reactive gas at a high base pressure of 1.3× 10− 2 Pa …

Effects of ion flux density and energy on the composition of TiNx thin films prepared by magnetron sputtering with an anode layer ion source

AM Qasim, F Ali, H Wu, RKY Fu, S Xiao, Y Li… - Surface and Coatings …, 2019 - Elsevier
Titanium nitride films deposited by conventional magnetron sputtering are prone to
contamination, especially residual gas species, and the composition and properties can be …

Some peculiarities of room-temperature ferromagnetism in ensembles of mixed-phase TiNx-TiOy nanoparticles

IG Morozov, OV Belousova, S Sathasivam… - Materials Research …, 2021 - Elsevier
Abstract Mixed-phase TiN x-TiO y nanoparticles with an average particlesize of 27–120 nm
were prepared by the levitation-jet generator through condensation of Ti metal vapor in inert …