One of the most popular methods for reliability assessment of digital circuits is Fault Injection
(FI) in which the behavior of the circuit is simulated in presence of faults. In this paper, we …

Reliability is fast becoming a major concern due to the nanometric scaling of CMOS
technology. Accurate analytical approaches for the reliability evaluation of logic circuits …

Fast, accurate, and detailed Soft Error Rate (SER) estimation of digital circuits is essential for
cost-efficient reliable design. A major step to accurately estimate a circuit SER is the …

CMOS designs in the deep submicrometer era require statistical methods to accurately
estimate the circuit soft error rate (SER). However, process variation increases the …

Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft
error rate (SER) estimation has become an important and very challenging goal. In this work …

Soft errors in combinational logic circuits are emerging as a significant reliability concern for
nanoscale VLSI designs. This paper presents a novel sensitivity-based gate sizing …

Transient faults analysis is an important step in circuits designing flow. By a fast and
accurate scrutiny, it is possible to achieve a cost-effective and soft error tolerant system. In …

Fast and accurate estimation of soft error rate in VLSI circuits is an essential step in a soft
error tolerant ASIC design. In order to have a cost effective protection against radiation …

Nanometer integrated circuits are getting increasingly vulnerable to soft errors and making
the soft error rate (SER) estimation an important challenge. In this study, a novel approach is …

Soft errors are a growing concern in highly scaled CMOS technologies; estimating error
rates for a given design remains very challenging. This article presents a fast statistical soft …