T Xie, B Tao, R Zhao, X Chen, Z Li, M Zhao, W Chen - Measurement, 2025 - Elsevier
Abstract The Transverse Seebeck Effect (TSE) in a 20° inclined epitaxial nitrogen-doped 4H-
SiC thin film was observed for the first time. When excited by a 248 nm pulsed laser with a …