A Aziz, ET Breyer, A Chen, X Chen… - … , Automation & Test …, 2018 - ieeexplore.ieee.org
In this paper, we consider devices, circuits, and systems comprised of transistors with integrated ferroelectrics. Said structures are actively being considered by various …
M Liu, HN Jaiswal, S Shahi, S Wei, Y Fu, C Chang… - ACS …, 2021 - ACS Publications
Room-temperature Fermi–Dirac electron thermal excitation in conventional three- dimensional (3D) or two-dimensional (2D) semiconductors generates hot electrons with a …
W Cheng, R Liang, G Xu, G Yu, S Zhang… - IEEE Journal of the …, 2020 - ieeexplore.ieee.org
In this paper, an N-type silicon line tunneling TFET (LT-TFET) with an ultra-shallow N+ pocket was proposed. The pocket was formed by using the germanium preamorphization …
R Dutta, SC Konar, N Paitya - Computational Advancement in …, 2020 - Springer
The continuous progress in the development of tunnel field-effect transistors (TFETs) by replacing the conventional metal-oxide field-effect transistors is to satisfy the development of …
We report a temperature independent subthreshold slope (SS) of∼ 47 mV/dec at low temperature in a triple top gate graphene tunnel field-effect transistor (TFET). The outer …
Transistor downscaling by Moore's law has facilitated drastic improvements in information technology, but this trend cannot continue because power consumption issues have pushed …
K Aishwarya, B Lakshmi - Radiation Effects and Defects in Solids, 2023 - Taylor & Francis
All electronic devices when used in a radiation environment undergo significant changes in their electrical properties. It is interesting to explore the effects of radiation, not only on …
Developing low-power FETs holds significant importance in advancing logic circuits, especially as the feature size of MOSFETs approaches sub-10 nanometers. However, this …
V Kumar, RK Maurya, G Rawat… - Semiconductor …, 2023 - iopscience.iop.org
In the present work, a high-k dielectric hafnium dioxide and lead zirconate titanate (PZT) have been incorporated as a ferroelectric (FE) layer in the gate stack. The I on/I off ratio …