JM Shaw, PF Seidler - IBM Journal of Research and …, 2001 - ieeexplore.ieee.org
For the past forty years inorganic silicon and gallium arsenide semiconductors, silicon dioxide insulators, and metals such as aluminum and copper have been the backbone of the …
Porous insulators are utilized in the wiring structure of microelectronic devices as a means of reducing, through low dielectric permittivity, power consumption and signal delay in …
EP Chan, S Kundu, Q Lin… - ACS applied materials & …, 2011 - ACS Publications
The viscoelastic properties of polymer thin films can have a significant impact on the performance in many small-scale devices. In this work, we use a phenomenon based on a …
R Stoemmer - US Patent 7,230,509, 2007 - Google Patents
An acoustic mirror includes constituent layers that are substantially odd multiples of λ/4. The constituent layers include a first impedance layer and a second impedance layer, where the …
T Schiml, S Biesemans, G Brase… - 2001 Symposium on …, 2001 - ieeexplore.ieee.org
We describe an advanced 0.13/spl mu/m CMOS technology platform optimized for density, performance, low power and analog/mixed signal applications. Up to 8 levels of copper …
SM Gates, JC Hedrick, SV Nitta… - US Patent …, 2004 - Google Patents
(57) ABSTRACT A metal wiring plus low-k dielectric interconnect Structure of the dual damascene-type is provided wherein the con ductive metal lines and vias are built into a …
T Weidman, N Bekiaris, J Chang… - US Patent 6,806,203, 2004 - Google Patents
US6806203B2 - Method of forming a dual damascene structure using an amorphous silicon hard mask - Google Patents US6806203B2 - Method of forming a dual damascene structure …
M Tada, N Inoue, Y Hayashi - IEEE transactions on electron …, 2009 - ieeexplore.ieee.org
Challenges and issues with the scaling of low-k/Cu interconnects in ultra-large-scale integration (ULSI) devices are reviewed, and the performance of interconnects is featured by …