High‐performance vacuum‐processed metal oxide thin‐film transistors: a review of recent developments

HJ Kim, K Park, HJ Kim - Journal of the Society for Information …, 2020 - Wiley Online Library
Since 2010, vacuum‐processed oxide semiconductors have greatly improved with the
publication of more than 1,300 related papers. Although the number of researches on oxide …

Improving Device Characteristics of Dual-Gate IGZO Thin-Film Transistors with Ar–O2 Mixed Plasma Treatment and Rapid Thermal Annealing

WS Liu, CH Hsu, Y Jiang, YC Lai, HC Kuo - Membranes, 2021 - mdpi.com
In this study, high-performance indium–gallium–zinc oxide thin-film transistors (IGZO TFTs)
with a dual-gate (DG) structure were manufactured using plasma treatment and rapid …

Effects of Al2O3 surface passivation on the radiation hardness of IGTO thin films for thin-film transistor applications

SH Hwang, K Yatsu, DH Lee, IJ Park, HI Kwon - Applied Surface Science, 2022 - Elsevier
In this study, we examined the effects of aluminum oxide (Al 2 O 3) surface passivation on
the radiation damage of indium-gallium-tin oxide (IGTO) thin films and radiation hardness of …

Interface Engineering of Metal‐Oxide Field‐Effect Transistors for Low‐Drift pH Sensing

H Ren, K Liang, D Li, M Zhao, F Li… - Advanced Materials …, 2021 - Wiley Online Library
Field‐effect transistors (FETs) with nanoscale channels have emerged as excellent
platforms for constructing high‐sensitivity biosensors. However, in typical FET‐based …

Rational design of oxide heterostructure InGaZnO/TiO2 for high-performance thin-film transistors

A Abliz, P Nurmamat, D Wan - Applied Surface Science, 2023 - Elsevier
In this study, hetero-structured and self-passivated oxide thin film transistors (TFTs) were
fabricated, wherein the channel comprised a N 2 O plasma (a-IGZO: N 2 O) treated a-IGZO …

Illuminating trap density trends in amorphous oxide semiconductors with ultrabroadband photoconduction

GW Mattson, KT Vogt, JF Wager… - Advanced Functional …, 2023 - Wiley Online Library
Under varying growth and device processing conditions, ultrabroadband photoconduction
(UBPC) reveals strongly evolving trends in the defect density of states (DoS) for amorphous …

Ultrahigh-mobility and solution-processed inorganic P-channel thin-film transistors based on a transition-metal halide semiconductor

HJ Lee, S Lee, Y Ji, KG Cho, KS Choi… - … applied materials & …, 2019 - ACS Publications
The development of p-channel devices with comparable electrical performances to their n-
channel counterparts has been delayed due to the lack of p-type semiconductor materials …

High-performance Zinc-Tin-Oxide thin film transistors based on environment friendly solution process

Q Zhang, G Xia, L Li, W Xia, H Gong, S Wang - Current applied physics, 2019 - Elsevier
Abstract Zinc-Tin-Oxide (ZTO) thin films were fabricated using a simple and eco-friendly sol-
gel method and their application in thin film transistors (TFTs) was investigated. Annealing …

Recent progress in the development of backplane thin film transistors for information displays

G Byeon, SC Jang, T Roh, JM Park… - Journal of Information …, 2023 - Taylor & Francis
This review aims to provide a technical roadmap and an overview of recent progress in the
development of backplane thin film transistors (TFTs) for organic light-emitting diodes flat …

Enhanced reliability of In–Ga–ZnO thin-film transistors through design of dual passivation layers

A Abliz, D Wan, JY Chen, L Xu, J He… - … on Electron Devices, 2018 - ieeexplore.ieee.org
This paper investigates the effects of different passivation layers (PVLs) on the electrical
performance and reliability of amorphous indium gallium zinc oxide (a-In-Ga-ZnO) thin film …