Failure mechanisms of solder interconnects under current stressing in advanced electronic packages

YC Chan, D Yang - Progress in Materials Science, 2010 - Elsevier
The pursuit of greater performance in microelectronic devices has led to a shrinkage of
bump size and a significant increase in electrical current. This has resulted in a high current …

Electromigration and thermomigration in Pb-free flip-chip solder joints

C Chen, HM Tong, KN Tu - Annual Review of Materials …, 2010 - annualreviews.org
Pb-free solders have replaced Pb-containing SnPb solders in the electronic packaging
industry due to environmental concerns. Both electromigration (EM) and thermomigration …

Effect of electric current stressing on mechanical performance of solders and solder joints: A review

B Wang, W Li, S Zhang, X Li, K Pan - Journal of Materials Science, 2022 - Springer
Mechanical performance is one of the most important factors influencing the reliability of
solder joints. Heretofore, plenty of works have been conducted on reliability of solder joints …

Morphologies, orientation relationships and evolution of Cu6Sn5 grains formed between molten Sn and Cu single crystals

HF Zou, HJ Yang, ZF Zhang - Acta Materialia, 2008 - Elsevier
The morphologies and orientation relationships of Cu6Sn5 grains formed between Sn and
(001),(011),(111) and (123) Cu single crystals under liquid-and solid-state aging conditions …

Single-grit modeling and simulation of crack initiation and propagation in SiC grinding using maximum undeformed chip thickness

D Zhu, S Yan, B Li - Computational Materials Science, 2014 - Elsevier
The application of engineering ceramics is often limited due to its low machining efficiency
and surface/subsurface damage, of which surface/subsurface micro-crack is one of the …

Effect of Sn grain orientation on reliability issues of Sn-rich solder joints

YA Shen, JA Wu - Materials, 2022 - mdpi.com
Sn-rich solder joints in three-dimensional integrated circuits and their reliability issues, such
as the electromigration (EM), thermomigration (TM), and thermomechanical fatigue (TMF) …

The reliability of lead-free solder joint subjected to special environment: a review

J Wang, S Xue, P Zhang, P Zhai, Y Tao - Journal of Materials Science …, 2019 - Springer
With the rapid development of electronical products, many primary challenges arise in the
field of design and manufacture, among which the property of electronical packaging …

Reduction of electromigration damage in SAC305 solder joints by adding Ni nanoparticles through flux doping

MN Bashir, A Haseeb, AZMS Rahman… - Journal of materials …, 2015 - Springer
The characteristics of interfacial intermetallic compounds (IMCs) can have serious impact on
the reliability of solder joints. In this study, Ni nanoparticles (NPs) were added to SAC305 …

A review of recent research on the mechanical behavior of lead-free solders

Y Yao, X Long, LM Keer - Applied …, 2017 - asmedigitalcollection.asme.org
Due to the restriction of lead-rich solder and the miniaturization of electronic packaging
devices, lead-free solders have replaced lead-rich solders in the past decades; however, it …

Size and volume effects on the strength of microscale lead-free solder joints

LM Yin, XP Zhang, C Lu - Journal of electronic materials, 2009 - Springer
The fracture behavior of microscale lead-free Sn-3.0 Ag-0.5 Cu solder joints of different sizes
was investigated under quasistatic microtension loading. The experimental results show that …