Machine Learning-Assisted Multiobjective Optimization of Advanced Node Gate-All-Around Transistor for Logic and RF Applications
M Ehteshamuddin, K Sheelvardhan… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this work, using multiobjective optimization (MOO) technique, design optimization of a
gate-all-around field-effect transistor (GAAFET) has been performed for improved device …
gate-all-around field-effect transistor (GAAFET) has been performed for improved device …
ANN-based framework for modeling process induced variation using BSIM-CMG unified model
In this work, we present a machine-learning augmented compact modeling framework for
modeling process induced variations in advanced semiconductor devices. The framework …
modeling process induced variations in advanced semiconductor devices. The framework …