The key scientific issues in the application and development of semiconductor
micro/nanodevices and optoelectronics components have driven scientists to investigate in …

A comparative study of immunoglobulin G (IgG) immobilization was performed, both on a
thiolated protein G layer, where this immobilization was due to affinity binding with an Fc …

Real-time spectroscopic ellipsometry (SE) has been applied to investigate the nucleation
and grain growth processes in microcrystalline silicon (μ c− S i: H) thin films deposited by a …

Conjugated polymers are attracting worldwide attention due to their potential for use as the
active layer in advanced electronic, optoelectronic, and energy harvesting applications, and …

Electrochromic (EC) smart windows are able to decrease our energy footprint while
enhancing indoor comfort and convenience. However, the limited durability of these …

In this paper, the theoretical analysis of the correctness of applying the effective medium
approximation (EMA) at the ellipsometric studies of rough surfaces is presented. Within this …

A Mueller matrix spectroscopic ellipsometry approach was used to investigate the
anisotropic dielectric constants of corundum α-(Al x Ga 1− x) 2 O 3 thin films in their below …

In this paper we present a method for the vertical calibration of a metrological atomic force
microscope (AFM), which can be applied to most AFM systems with distance sensors. A …

Zirconium nitride (ZrN) is widely used in many industrial sectors for its outstanding
performances including its mechanical properties, high chemical and thermal stability …

We find that a five-phase (substrate, mixed native oxide and roughness interface layer, metal
oxide thin film layer, surface ligand layer, ambient) model with two-dynamic (metal oxide thin …