Fast demodulated white-light interferometry-based fiber-optic Fabry–Perot cantilever microphone

K Chen, Z Yu, Q Yu, M Guo, Z Zhao, C Qu, Z Gong… - Optics letters, 2018 - opg.optica.org
We demonstrate a highly sensitive and stable fiber-optic Fabry–Perot cantilever microphone
based on fast demodulated white-light interferometry. The cavity length of the low-finesse …

Imaging water thin films in ambient conditions using atomic force microscopy

S Santos, A Verdaguer - Materials, 2016 - mdpi.com
All surfaces exposed to ambient conditions are covered by a thin film of water. Other than at
high humidity conditions, ie, relative humidity higher than 80%, those water films have …

Fiber-optic photoacoustic gas sensing: a review

X Zhao, HC Qi, Y Xu, C Li, M Guo… - Applied Spectroscopy …, 2024 - Taylor & Francis
Fiber-optic photoacoustic (PA) sensing has important applications in trace gas detection.
The fiber-optic Fabry-Perot acoustic sensor implemented applying a cantilever is a novel …

Direct measurement of the capillary condensation time of a water nanobridge

MV Vitorino, A Vieira, CA Marques, MS Rodrigues - Scientific Reports, 2018 - nature.com
Water menisci wet all sorts of cavities, produce among the most intense forces at the
nanoscale and play a role in many physical and chemical processes. The physical …

Effect of sliding friction in harmonic oscillators

MV Vitorino, A Vieira, MS Rodrigues - Scientific Reports, 2017 - nature.com
Sliding friction is ubiquitous in nature as are harmonic oscillators. However, when treating
harmonic oscillators the effect of sliding friction is often neglected. Here, we propose a …

[HTML][HTML] Influence of spurious resonances on the interaction force in dynamic AFM

L Costa, MS Rodrigues - Beilstein journal of nanotechnology, 2015 - beilstein-journals.org
The quantification of the tip–sample interaction in amplitude modulation atomic force
microscopy is challenging, especially when measuring in liquid media. Here, we derive …

The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers

RI Revilla - Nanotechnology, 2016 - iopscience.iop.org
The jump-into-contact (JIC) phenomenon in biased atomic force microscopy (AFM) probes
on dielectric films is studied. The influence of the film thickness on the position at which the …

Desenvolvimento de um microscópio de força atómica com deteção em deflexão de feixe auxiliada por interferometria

TRP Cordeiro - 2024 - repositorio.ul.pt
Neste trabalho descreve-se o desenvolvimento e a criação de um Microscópio de força
atómica. Normalmente neste tipo de instrumentos recorre-se a uma metodologia de …

Caractérisation à l'échelle micro/nanométrique par Force Feedback Microscope

S Carpentier - 2016 - theses.hal.science
La mesure quantitative de propriétés mécaniques à l'échelle nanométrique en matière molle
est un réel enjeu pour de nombreux domaines, en particulier en biologie. Cette thèse …

Frequency dependent visco-elastic properties of a water nanomeniscus: an afm study in force feedback mode

S Carpentier, MS Rodrigues, L Costa… - arXiv preprint arXiv …, 2016 - arxiv.org
Recently, using an Atomic Force Microscope and a single cantilever excited at different
frequencies it was shown that water nanomeniscus can exhibit a transition in mechanical …