This paper presents an overview of a comprehensive collection of on-line testing techniques
for VLSI. Such techniques are for instance: self-checking design, allowing high quality …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Self-checking circuits can detect the presence of both transient and permanent faults. A self-
checking circuit consists of a functional circuit that produces encoded output vectors and a …

Stochastic computation, as presented in this paper, exploits the statistical nature of
application-level performance metrics, and matches it to the statistical attributes of the …

Посвящена вопросам схемотехники самопроверяемых цифровых устройств. Изложены
принципы построения самопроверяемых дискретных устройств и их свойства …

This paper discusses the state of the art and future trends of on-line testing techniques for
VLSI. It cautions that emerging technological constraints and application requirements will …

Achieving robustness and energy efficiency in nanoscale CMOS process technologies is
made challenging due to the presence of process, temperature, and voltage variations …

Considers designing quasi-delay-insensitive (QDI) combinational circuits (CCs), a class of
self-timed (asynchronous) circuits. The necessity of coding both inputs and outputs of any …

In this paper, we consider two restricted types of dynamic orthogonal segment intersection
search problems. One is the problem in which the underlying set is updated only by …

Asynchronous controllers exhibit various characteristics that limit the effectiveness and
applicability of the concurrent error detection (CED) methods developed for their …