extremely thin amorphous indium oxide transistors

A Charnas, Z Zhang, Z Lin, D Zheng… - Advanced …, 2024 - Wiley Online Library
Amorphous oxide semiconductor transistors have been a mature technology in display
panels for upward of a decade, and have recently been considered as promising back‐end …

Monolithic 3D integration as a pathway to energy-efficient computing and beyond: From materials and devices to architectures and chips

Y Fan, R An, J Tang, Y Li, T Liu, B Gao, H Qian… - Current Opinion in Solid …, 2024 - Elsevier
As emerging technologies like artificial intelligence (AI) and big data continue to evolve, the
demand for high-performance computing (HPC) has been increasing, driving the …

Back-end-of-line-compatible scaled InGaZnO transistors by atomic layer deposition

J Zhang, Z Lin, Z Zhang, K Xu, H Dou… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this work, we report on back-end-of-line (BEOL)-compatible InGaZnO indium gallium zinc
oxide (IGZO) thin film transistors (TFTs) with extreme scaled device dimension including …

Study of the Energy Crossing Between Excited States Affected by the Electronegativity of Substituents for Three 4-Azido-1, 8-naphthalimide Derivatives

A Huang, H Xu, Z Xia, W Hao, D Wu… - The Journal of Physical …, 2024 - ACS Publications
Rapid detection of H2S is crucial for human physiological health and natural ecosystems. In
this study, the fluorescent sensing mechanisms of three 4-azido-1, 8-naphthalimide-based …

Strong Immunity to Drain-Induced Barrier Lowering in ALD-Grown Preferentially Oriented Indium Gallium Oxide Transistors

GB Kim, T Kim, SW Bang, JS Hur, CH Choi… - … Applied Materials & …, 2024 - ACS Publications
Drain-induced barrier lowering (DIBL) is one of the most critical obstacles degrading the
reliability of integrated circuits based on miniaturized transistors. Here, the effect of a …

Universal PBTI Relaxation on the Negative VTH Shift in Oxide Semiconductor Transistors and New Insights

Z Lin, J Zhao, X Li, L Kang, J Li, Y Wu… - IEEE Electron Device …, 2023 - ieeexplore.ieee.org
In this work, the positive bias temperature instability (PBTI) degradation of ZnO transistors by
atomic layer deposition (ALD) is systematically investigated by using an extended measure …

Atomic Layer Deposition of WO3-Doped In2O3 for Reliable and Scalable BEOL-Compatible Transistors

C Yoo, J Hartanto, B Saini, W Tsai, V Thampy… - Nano Letters, 2024 - ACS Publications
Tungsten oxide (WO3) doped indium oxide (IWO) field-effect transistors (FET), synthesized
using atomic layer deposition (ALD) for three-dimensional integration and back-end-of-line …

Effect of Single Spinel Phase Crystallization on Drain-Induced-Barrier-Lowering in Submicron Length IZTO Thin-Film Transistors

GB Kim, T Kim, CH Choi, SW Chung… - IEEE Electron Device …, 2023 - ieeexplore.ieee.org
This study shows the effect of single spinel phase crystallization on drain-induced barrier
lowering (DIBL) of indium-zinc-tin-oxide (IZTO) thin-film transistors (TFTs) with submicron …

Indium zinc oxide nanosheet transistor with 2 nm channel thickness for monolithic three-dimensional integrated circuit

ZH Li, TC Chiang, YC Chen, HH Lee… - IEEE Electron …, 2023 - ieeexplore.ieee.org
We have successfully fabricated an amorphous indium zinc oxide (a-IZO) thin film transistor
(TFT) with a 2 nm-thick nanosheet channel, which demonstrated an impressive mobility of …

Self-Aligned Top-Gate IGZO TFT with Stepped Structure for Suppressing Short Channel Effect

JK Lee, S An, SY Lee - IEEE Electron Device Letters, 2023 - ieeexplore.ieee.org
In this work, the self-aligned coplanar top gate In-Ga-Zn-O thin-film transistor with a stepped
substrate structure was investigated to suppress the short-channel effect. Usually, roll-off …