A 219-µW ultra-low power low-noise amplifier for IEEE 802.15. 4 based battery powered, portable, wearable IoT applications

SC Gladson, AH Narayana, V Thenmozhi… - SN Applied Sciences, 2021 - Springer
Due to the increased processing data rates, which is required in applications such as fifth-
generation (5G) wireless networks, the battery power will discharge rapidly. Hence, there is …

Development of the WFEE subsystem for the X-IFU instrument of the ATHENA space observatory

S Chen, D Prêle, C Beillimaz, F Voisin… - … 2018: Ultraviolet to …, 2018 - spiedigitallibrary.org
The X-IFU is one of the two instruments of the ESA ATHENA space mission, at present in
feasibility phase (phase A). It is an X-Ray spectral imager designed to have an …

A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment

T Yoshikawa, M Ishimaru, T Iwata, F Mori… - Journal of Electronic …, 2021 - Springer
A high-speed wireline interfaces, eg LVDS (Low Voltage Differential Signaling), are widely
used in the aerospace field for powerful computing in artificial satellites and aircraft. This …

Radiation-Hardened-by-Design (RHBD) Digital Design Approaches: A Case Study on an 8051 Microcontroller

KS Chong, NKZ Lwin, W Shu… - 2020 IEEE International …, 2020 - ieeexplore.ieee.org
Advanced satellites and/or high-level (levels 4 and 5) autonomous vehicles demand high
reliability integrated circuits (ICs) with ultra-low error rates. One solution is to use radiation …

[PDF][PDF] Space product assurance

E Secretariat - 2008 - microelectronics.esa.int
This Handbook is one document of the series of ECSS Documents intended to be used as
supporting material for ECSS Standards in space projects and applications. ECSS is a …

Impact on Latchup Immunity due to the Switch From Epitaxial to Bulk Substrate

GFE Gene, NC Lee, TK Tong… - 2006 IEEE International …, 2006 - ieeexplore.ieee.org
A comparison of the guardring efficiency is done between the epitaxial silicon and bulk
silicon for sub-quarter micron technology. The dose optimization and use of ultra high …

[PDF][PDF] Oscilador Controlado por Tensão com Estrutura em Anel, com Critérios de Confiabilidade aos Efeitos da Radiação.

AMP Junior, A de Matos - 2017 - core.ac.uk
Este trabalho apresenta um Oscilador Controlado por Tensão (VCO) com estrutura em anel,
usando tecnologia CMOS DARE-UMC 180 nanômetros. O oscilador apresentado será …

Investigation into radiation hardening techniques on differential receiver and power management unit in 0.8 um CMOS for space applications

SK Kasodniya - 2019 - drsr.daiict.ac.in
This report details out radiation hardening techniques, their implementation on Di erential
Receiver and Power Management Unit. Dierential Receiver ASIC is designed with …

Determining the root cause of a neighbouring-cell-interaction-induced latch-up failure event

HW Ho, WWY Lau, SH Goh, BL Yeoh… - 2016 IEEE 23rd …, 2016 - ieeexplore.ieee.org
It has always been a challenge to identify the failure mechanism of electrical overstress and
latch-up failures due to misleading failure modes observed from electrical fault isolation. A …

CMOS structure and latch-up preventing method of same

FM Chao, MI Chen, YK Chin, YC Wang - US Patent 8,426,922, 2013 - Google Patents
A CMOS structure includes a PMOS portion and an NMOS portion isolated from each other
via a P-well region disposed next to the PMOS portion and an N-well region disposed …