Radiation-induced soft errors have posed an increasing reliability challenge to
combinational and sequential circuits in advanced CMOS technologies. Therefore, it is …

Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft
error rate (SER) estimation has become an important and very challenging goal. In this work …

Radiation-induced soft errors have posed an ever increasing reliability challenge as device
dimensions keep shrinking in advanced CMOS technology. Therefore, it is imperative to …

With drastic device shrinking, low operating voltages, increasing complexities, and high
speed operations, radiation-induced soft errors have posed an ever increasing reliability …

The advent of advanced microelectronic technologies and scale downing into nanometer
dimensions has made current digital systems more susceptible to faults and increases the …

Planning is an integral part of agile software project management. Several agile software
planning tools were developed; they grow in number and complexity. Our analysis of 30 of …

One of the interesting features of software systems is that a large number of soft-errors are
inherently derated (masked) at the software level. The rate of error-deration may depend on …

Using 3-D technology computer-aided design numerical simulation, we comprehensively
analyze the impact of node-state transition on a single-event transient (SET) pulse …

The revolution in chip manufacturing processes spanning five decades has proliferated high
performance and energy-efficient nano-electronic devices across all aspects of daily life. In …

The reliability metric has a direct relationship to the amount of value produced by a circuit,
similar to the performance metric. With advances in CMOS technology, digital circuits …