We present a germanium “Ge-on-Si” CMOS image sensor with backside illumination for the near-infrared (NIR) electromagnetic waves (wavelength range 300 to 1700 nm) detection …
We study the nano-and micro-structures that increase the optical efficiency (OE) of the complementary metal oxide semiconductor (CMOS) image pixels in visible and infrared. We …
We study the nano-and micro-structures that increase the optical efficiency of the CMOS image pixels in visible and infrared. We consider the difference between the micro-holes at …
We present a Ge-on_Si CMOS image sensor with backside illumination for the near-infrared electromagnetic waves, wavelengths range 300-1700nm, detection essential for optical …
The bandgap limitation of silicon (Si) limits the imaging capabilities of conventional Si CMOS Image Sensors to wavelengths below 1100 nm and thus are inadequate for near-infrared …