One of the most popular methods for reliability assessment of digital circuits is Fault Injection
(FI) in which the behavior of the circuit is simulated in presence of faults. In this paper, we …

The treewidth of a graph is a useful combinatorial measure of how close the graph is to a
tree. We prove that a quantum circuit with T gates whose underlying graph has a treewidth d …

An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …

Quantum-dot cellular automata (QCA) has been studied extensively as a promising
switching technology at nanoscale level. Despite several potential advantages of QCA …

Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …

Nanotechnology-based fabrication is expected to offer the extra density and potential
performance to take electronic circuits beyond the scaling limits reached by CMOS …

In Steganography, the total message will be invisible into a cover media such as text, audio,
video, and image in which attackers don't have any idea about the original message that the …

We propose the probabilistic transfer matrix (PTM) framework to capture nondeterministic
behavior in logic circuits. PTMs provide a concise description of both normal and faulty …

Transient faults in logic circuits are becoming an important reliability concern for future
technology nodes. Radiation-induced faults have received significant attention in recent …

Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits
have become more susceptible to radiation induced transient faults. In this paper, we …